Bruker’s DektakXT™ Stylus Profiler features a revolutionary design that enables unmatched repeatability that is better than 5 angstroms. This major milestone in stylus profiler performance is the culmination of over forty years of Dektak® innovation and industry leadership. Through its combination of industry firsts, DektakXT delivers the ultimate in performance, ease of use and value to enable better process monitoring from R&D to QC. The technological breakthroughs incorporated in this 10th generation Dektak enable critical nanometer-level surface measurements for the microelectronics, semiconductor, solar, high-brightness LED, medical, scientific and materials science industries.

　　DektakXT Delivers

　　■ Unmatched performance with better than 5Å repeatability

　　– Single-arch design provides breakthrough scan stability

　　– Leading-edge “smart electronics” establish new low noise benchmark

　　– New hardware configuration offers 40% faster data collection times than prior generations

　　– 64-bit, parallel processing Vision64 software architecture delivers up to 10 times faster data analyses

　　■ Unprecedented efficiency and ease of use

　　– Intuitive Vision64™ user interface workflow simplifies operation

　　– Self-aligning styli enables effortless tip exchange

　　■ Incomparable value from the world leader in stylus profilers

　　– Bruker delivers premier performance in an affordable package

　　– Single sensor design offers low force and extended range in a single platform