This document contains sample preparation procedures for atomic force microscopy (AFM).  These procedures have been optimized and if followed carefully they will give the results  as described. The main objective of this document is to report on sample preparations  for more effective use of AFM by researchers using or wishing to use AFM.  AFM explores the nano or sub-nano scale, so the results can change drastically depending on  how the sample is prepared, as well as the AFM system or measurement.  Through this AFM user handbook, we hope that researchers prepare their samples well  and obtain AFM results that fit the purpose of the study.