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AFM - 原子力显微镜
上海伯东代理英国 NanoMagnetics AFM - 原子力显微镜, 高精度和高分辨率使其可以分析许多不同样品, AFM - 原子力显微镜可以在液体或空气中测量. 手动校准, 采用白光 LED, 亮度可调, 视野更佳. Z 噪音降至25 fm/√Hz.

AFM - 原子力显微镜系统参数
标准扫描模式
* Intermittent Contact / Phase Contrast
* Contact
* Non-contact
* Lateral Force
* MFM
* EFM
(Any single mode standard, additional modes may be
added as options.)
可选扫描模式
* Scanning Tunneling Microscope (STM)
* Piezo Response Force Microscope (PrFM)
* Kelvin Probe Force Microscope (KPFM)
* Scanning Spreading Resistance Microscope (SSRM)
* Conductive AFM
* Capacitance Force Microscopy (CFM)
* Force Modulation Microscopy (FMM)
* AFM Spectroscopies
* Nanoindentation
* Nanolitography
Maximum Z Resolution
* <0.03nm with 100μmx100μm scanner
* <0.01nm with 40μmx40μm scanner
* <0.005nm with 4μmx4μm scanner
Static/Dynamic RMS Cantilever Z Noise
* <25fm √Hz noise floor with laser RF modulation
Scan Range
* 4x4x2 μm or 40x40x4 μm or 100x100x8 μm
STM Current Range
* 1pA-10nA, < 10fA / √Hz noise floor
Maximum Sample Size/Height
* 30x30x10 mm
Approach
* Software controlled
* Motorized
* <50 mm range with <250 nm sensivity
Camera
* CCD analog colour camera
Camera Resolution
* < 2 μm
Light Source for Optical Microscope
* White LED, adjustable from software
Signal Processing
* 16 bit ADCs / 24 bit DACs
* Digital feedback with FPGA / DSP
* Simultaneous scan of 16 channels
up to 4096x4096 pixels
Cantilevers
* All of the commercial cantilevers can be used
Acoustic and Vibration Isolation
* Multilayer acoustic enclosure 180°access
0.3Hz passive vibration isolation table

     Polyethyleneimine            Phosphorylcolamine Topography  Phosphorylcolamine Phase Contrast    Polyvinyl Acetate

英国 NanoMagnetics 仪器 1998年在牛津成立, 作为原子力显微镜 AFM 制造商, 主营环境扫描探针显微镜 SPM, 低温扫描探针显微镜 LT-SPM 等, 适用于产品表面特征分析, 生命科学, 原位成像, 材料科学, 薄膜等领域. 原子力显微镜 AFM 广泛应用于牛津大学, 斯坦福, 京都大学, NASA 等学府和科研院所.