产品描述
Accepts either rod-shaped or conically-shaped specimens
Ideal for specimens prepared by focused ion beam
Ideal for atom probe tomography and field ion microscopy specimens
Allows 360o image acquisition and tomographic reconstruction without the loss of information due to the missing wedge
The On-Axis Rotation Tomography Holder accepts either rod-shaped or conically-shaped specimens and rotates them fully through 360o about the axis of the holder.
On-axis rotation tomography yields results without the loss of any information, thus providing the maximum achievable amount of data from the specimen.
The On-Axis Rotation Tomography Holder features a cylindrical specimen cartridge into which a sample post is inserted. Sample posts are available in a diameter of either 1.8 mm to accept common APFIM specimen mounts or 1 mm to accept FIB-prepared specimens.
The sample post containing the specimen is clamped into the specimen cartridge which precisely fits within the body of the holder. Longitudinal movement of the specimen cartridge is manually activated in order to retract the loaded cartridge into the body of the holder to protect the specimen during holder insertion into and removal from the TEM goniometer.
Initially, the specimen can be fully rotated through 360o to select the proper specimen orientation. A 3-position, precision indexing mechanism then provides the means to orient the specimen in 120o increments. At each increment, the microscope’s goniometer is tilted to +60o to acquire a tomographic tilt series.
接受杆状或圆锥形试样
非常适合通过聚焦离子束制备样品
适用于原子探针断层扫描和场离子显微镜样品
允许360°图像采集和断层重建，而不会因缺少楔块而丢失信息
高度创新的杆或锥试样支架
轴上旋转层析成像支架可接受杆状或圆锥形标本，并将其绕支架轴旋转360°。
轴上旋转层析成像在不损失任何信息的情况下产生结果，从而提供来自样本的最大可实现数据量。
活动
轴上旋转层析成像支架具有一个圆柱形样品盒，样品柱插入其中。样品柱的直径为1.8mm，用于接受普通APFIM样品支架，或1mm，用于接受FIB制备的样品。
将装有样品的样品柱夹在样品盒中，样品盒精确地安装在支架的主体内。手动启动样本盒的纵向移动，以便将加载的样本盒缩回支架主体中，以在支架插入TEM测角仪和从TEM测角仪移除过程中保护样本。
最初，样品可以完全旋转360°，以选择合适的样品方向。然后，一个3位精密分度机构提供了以120o增量定向样本的方法。在每次增量时，显微镜的角度计都会倾斜到+60o，以获取断层摄影倾斜序列。
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