In 1849 when Henry Sorby, the father of petrography, prepared a thin section, he may not have envisioned that one day his technique would be use to analyze many concrete, cement, soils, Biomaterials, and polymers, to name a few. Sorby demonstrated to the scientific community that by using simply techniques. One could reveal the microstructure of materials observed with a microscope. Although Sorby’s method of preparation was crude compared to the methods used today, his basic technique for preparing and examining a specimen has remained fairly similar.
There are two types of specimens routinely prepared for analysis, thin section and polished bulk specimens. For polished bulk specimens, the surface is prepared for examination with a reflected light microscope. Thin section, on the other hand, are extremely thin, generally 30µm or thinner, and are typically observed with a transmitted polarized light microscope. The chart to the right describes a general procedure required to prepare both thin section and polished bulk specimens.
Since 1936, Buehler has been the world leader in developing and supplying high quality laboratory specimen preparation equipment and consumables products. Buehler’s experience paired with today’s technologies help deliver the fullest product offering for all applications. Together with our technical expertise and lab equipment, Buehler is prepared to be your materials preparation partner.
岩相学是使用显微镜研究岩石和矿物的科学。薄截面试样对于鉴定岩石和矿物，以及表征诸如解理、孪晶、反射率等性能是很有用的。
用于岩相分析的试样有薄截面试样和经过抛光的块状试样两类。经过抛光的块状试样与金相试样相似，制备好的试样表面要放在反射光显微镜下进行观察。薄截面试样则使用透射偏振光显微镜进行观察。
透明薄截面试样的一般制备顺序如下：切割、真空浸透、磨光、粘接在玻璃载片上、再次切割、磨光、抛光。薄截面试样的制备要比制备经过抛光的块状试样困难得多。通常，一块薄截面试样必须制备到厚度约为30μm，两面还应接近平行。
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