PP-TOFMS Depth Profiling of ZnO Thin layers co-doped with Rare Earths for Photonic Materials-应用文献-

PP-TOFMS Depth Profiling of ZnO Thin layers co-doped with Rare Earths for Photonic Materials

应用领域：电子/电器/半导体，电子/电器/半导体

检测样品：ZnO Thin layers co-doped with Rare Earths

检测项目：GD-OES(PP-TOFMS Depth Profiling)，Structural Properties，Thickness and Optical Properties

参考标准：[1]The Rare Earth Elements: Fundamentals and Applications, David A. Atwood, John Wiley & Sons, 2013.,[2] Andries Maijerink, Lanthanide Ions as Photon Managers for Solar Cells, Material Matters, 6 (4) 113 (2011).