应用领域:地矿/钢铁/有色金属,电子/电器/半导体,汽车/铁路/船舶/交通,航空/航天,机械设备,纳米材料,高分子材料,生物质材料,地矿/钢铁/有色金属,电子/电器/半导体,汽车/铁路/船舶/交通,航空/航天,机械设备,纳米材料,高分子材料,生物质材料
检测样品:Semiconductor Devices
检测项目:Semiconductor Devices
参考标准:Oxford Instruments
Before volume production of semiconductor devices, it is crucial that the processes involved in the manufacture of a device are fully understood. To fully understand a process it is important to understand the chemistry and structure of a device down to the nm or even the atomic scale. Our developments in energy dispersive spectrometry (EDS) and electron backscatter diffraction (EBSD) ensure that you can collect the data that you need to understand your processes quickly and accurately.