NPFLEX 3D Surface Metrology System

for Large-Sample, Non-Contact Measurement & Analysis

• Characterize Large Shapes and Critical Angles — Measurement Flexibility • Collect High-Density, 3D Areal Information — Definitive Results • Measure with Nanometer Resolution — Revealed Detail • Perform Rapid Repeatable Data Acquisition

Bruker’s NPFLEX™ 3D Surface Metrology System brings unprecedented measurement capability and performance to precision manufacturing industries, enabling faster ramp-up times, improved product quality, and increased productivity. Based on white light interferometry, this non-contact system offers many benefits beyond such traditional contact measurement technologies as coordinate measuring machines (CMMs) and industrial stylus profilers. These benefits include three-dimensional (3D) images, rapid data-rich acquisition, and greater insight into part performance and functionality. The culmination of decades of expertise in interferometric technology and large-sample instrument design, the NPFLEX is the first optical metrology system to handle micro to macro features effortlessly on samples of widely varying sizes.