31-030 标准查询与下载
共找到 330 条与 相关的标准，共 22 页
本方法适用于电子级氢、氮、氩中痕量二氧化碳的测定，测定范围为0.05～16ppm
Method for determination of trace Carbon dioxide in electronic grade gases--Hydrogen flame ionzation detertor method
- ICS
- 31-030
- CCS
- L90
- 发布
- 1987-05-18
- 实施
- 1988-01-01
本方法适用于电子级氧中痕量二氧碳的测定，测定范围为0.1～14.6ppm。
Method for determination of trace carbon dioxide in electronic grade gases--Pre-cut hydrogen flame ionzation detector method
- ICS
- 31-030
- CCS
- L90
- 发布
- 1987-05-18
- 实施
- 1988-01-01
本方法适用于电子级氢中痕量氧十氩、氮的测定。应用此方法可同时测定甲烷、一氧化碳、二氧化碳，最低检测量为0.01ppm。
Method for determination of Oxygen with Argon and Nitrogen in electronic grade Hydrogen--Concentration gas chromatographic method
- ICS
- 31-030
- CCS
- L90
- 发布
- 1987-05-18
- 实施
- 1988-01-01
本方法适用于电子级氢中痕量氧和氩的测定，最低检测量为0.01ppm。
Method for determination of trace Oxygen and Argon in electronic grade Hydrogen--Concentration gas chromatographic method
- ICS
- 31-030
- CCS
- L90
- 发布
- 1987-05-18
- 实施
- 1988-01-01
本方法适用于电子级氩中痕量测定，应用此方法可同时测定其中甲烷，一氧化碳、二氧化碳含量，测定范围为1～51ppm。
Method for determination of Nitrogen in electronic grade Argon--Concentration gas chromatographic method (Part one)
- ICS
- 31-030
- CCS
- L90
- 发布
- 1987-05-18
- 实施
- 1988-01-01
本方法适用于电子级氩中痕量氮测定，应用此法可同时测定其中甲烷，一氧化碳和二氧化碳含量。测定范围为0.5～50ppm。
Method for determination of trace Nitrogen in electronic grade Argon--Concentration gas chromatographic method (Part two)
- ICS
- 31-030
- CCS
- L90
- 发布
- 1987-05-18
- 实施
- 1988-01-01
本方法适用于电子级氢、氮、氧、氩和氦中痕量氢的测定，测定范围为0.0 5～37ppm。
Method for determination of trace Hydrogen in electronic grade gases--Gas-sensitization chromatographic method
- ICS
- 31-030
- CCS
- L90
- 发布
- 1987-05-18
- 实施
- 1988-01-01
本标准适用子与衬底同型外延层厚度的测量，衬底和外延层室温电阻率应分别小于0.02Ω·cm和大于0.1Ω·cm，可测厚度大于2μm.
Method of measurement by infrared interference for thickness of homoepitaxial layers
- ICS
- 31-030
- CCS
- L90
- 发布
- 1987-02-10
- 实施
- 1987-07-01
本标准适用于测量重掺半导体体材料载流子浓度，也适用于测量外延层、埋层和扩散层的载流子浓度。
Method of measurement by infra-red reflection for charge carrier concentraiton of heavily doped semiconductors
- ICS
- 31-030
- CCS
- L90
- 发布
- 1987-02-10
- 实施
- 1987-07-01
Test methods for resin type flux for soft solder
- ICS
- 31-030
- CCS
- L90
- 发布
- 1986-01-21
- 实施
- 1986-10-01
Collection of single crystal Germaninm defects
- ICS
- 31-030
- CCS
- L90
- 发布
- 1986-01-21
- 实施
- 1986-10-01
本标准适用于压力加工方法制造的供电子、电气设备和仪表等电路焊接所用的树脂芯焊锡丝。
Resin-core solder tin wire for electronic industry
- ICS
- 31-030
- CCS
- L90
- 发布
- 1986-01-21
- 实施
- 1986-10-01
本标准适用于作半导体器件键合线用其直径等于或小于O.12mm的金属及其合金细丝的常温静力拉伸试验方法。
Methods for tensile testing of fine metal wires
- ICS
- 31-030
- CCS
- L90
- 发布
- 1983-12-22
- 实施
- 1984-10-01
Specification for paper stock for use in loudspeakers
- ICS
- 31-030
- CCS
- L90
- 发布
- 1983-03-01
- 实施
- 1983-10-01
General requirements for analysis of cathode carbonate (Provisional)
- ICS
- 31-030
- CCS
- L90
- 发布
- 1982-12-29
- 实施
- 1983-07-01
Method of measurement of granularity of cathode carbonate
- ICS
- 31-030
- CCS
- L90
- 发布
- 1982-12-29
- 实施
- 1983-07-01
Method of analysis of Thorium oxide and Rhenium in Thorium-Tungsten-Rhenium wire for use in vacuum devices
- ICS
- 31-030
- CCS
- L90
- 发布
- 1981-01-01
- 实施
- 1981-01-01
Methods for analysis of Cerium oxide in Cerium-Tungsten powder,plates and bars
- ICS
- 31-030
- CCS
- L90
- 发布
- 1981-01-01
- 实施
- 1981-01-01
Tungsten-Thorium-Rhenium wires for vacuum tubes
- ICS
- 31-030
- CCS
- L90
- 发布
- 1981-01-01
- 实施
- 1981-01-01
