31.020 电子元器件综合 标准查询与下载

IEC 60050-702:1992/AMD4:2018 修改件4.国际电工词汇（IEV）.第702部分:振荡、信号和相关设备

Amendment 4 - International Electrotechnical Vocabulary (IEV) - Part 702: Oscillations, signals and related devices

BS EN IEC 62435-4:2018 电子元件 电子半导体器件的长期存储 存储

Electronic components. Long-term storage of electronic semiconductor devices. Storage

EN IEC 62435-4:2018 电子元件 电子半导体器件的长期储存 第4部分：储存

Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage

BS EN IEC 60286-5:2018 自动处理组件的包装 矩阵托盘

What is BS EN IEC 60286 ‑ 5 – Matrix trays about ?      BS EN IEC 60286 ‑ 5 is an international standard that discusses packaging of components for automatic handling.   BS EN IEC 60286 ‑ 5 is the fifth part of the multi-series on matrix trays.

Packaging of components for automatic handling - Matrix trays

KS C IEC 60062:2018 电阻器和电容器的标记代码

Marking codes for resistors and capacitors

KS C IEC 60062-2018 电阻器和电容器的标记代码

Marking codes for resistors and capacitors

KS C IEC 60062-2018(2023) 电阻器和电容器的标记代码

Marking codes for resistors and capacitors

EN IEC 60286-5:2018 自动处理元件的包装 第5部分：矩阵托盘

Packaging of components for automatic handling - Part 5: Matrix trays

IECQ 03-3-1-2018 电子元器件的IEC质量评价体系(IECQ体系).程序规则.第1部分:IECQ批准的元件产品,相关材料和组装件计划,IECQ批准的组件.技术认证(IECQ AC-TC)

IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Procedure - Part 3-1: IECQ Approved Component Products, Related Materials & Assemblies Scheme, IECQ Approved Component - Technolgy Certification (IECQ AC-TC)

IECQ 02-2018 IEC电子元器件质量评定体系 (IECQ体系). 程序规则. IECQ体系验收IECQ认证机构用通用要求

This publication contains the general assessment procedures for the qualification of IECQ Certification Bodies (CBs) to enable their participation in the various Schemes of the IECQ System. These Rules of Procedure are to be used in conjunction with applicable IECQ System management Basic Rules (IEC CA 01 + IECQ 01-S), Rules of Procedure and Operational Documents as listed in normative references Clause 2 below.

IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Procedure - General requirements for the acceptance of IECQ Certification Bodies into the IECQ System

IECQ 03-5-2018 电子元器件的IEC质量评价体系(IECQ体系).程序规则.第5部分:IECQ HSPM计划.有害物质过程管理要求

General This publication contains the Rules of Procedure, hereinafter referred to as the "Rules", of the Scheme of the IECQ for the Hazardous Substance Process Management Requirements (IECQ HSPM Scheme). This IECQ HSPM Scheme Rules of Procedure provides the requirements specific to this Scheme and is to be used in conjunction with applicable IECQ System management Basic Rules (IEC CA 01 + IECQ 01-S), General Rules of Procedure (IECQ 03-1) and Operational Documents (OD). ISO 9001 application Permissible exclusions relating to Clause 7 of ISO 9001, as provided in ISO 9001:2008, are not accepted within the IECQ Schemes and Programmes. For the purposes of compliance with QC 080000 all requirements of ISO 9001:2015 shall apply.

IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Prodecure - Part 5: IECQ HSPM Scheme - Hazardous Substance Process Management Requirements

IECQ 03-3-2018 电子元器件的IEC质量评价体系(IECQ体系).程序规则.第3部分:IECQ批准的元件产品,相关材料和组装件计划

This publication contains the Rules of Procedure of the Scheme of the IECQ System, hereinafter referred to as the "Rules", for the Approved Component Products, Related Materials and Assemblies Scheme. (IECQ Approved Component Scheme). This IECQ Approved Component Scheme Rules of Procedure provides the requirements specific to this scheme and is to be used in conjunction with applicable IECQ System management Basic Rules (IEC CA 01 + IECQ 01-S), General Rules of Procedures (IECQ 03-1) and Operational Documents (OD).

IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Procedure - Part 3: IECQ Approved Component Products, Related Materials & Assemblies Scheme

IECQ 03-6-2018 电子元器件的IEC质量评价体系(IECQ体系).程序规则.第6部分:IECQ ITL计划.独立测试实验室评定项目要求

This publication contains the Rules of Procedure of the Scheme of the IECQ System, hereinafter referred to as the "Rules", for the Independent Testing Laboratory Scheme (IECQ ITL Scheme). This IECQ Independent Testing Laboratory Scheme Rules of Procedure provides the requirements specific to this scheme and is to be used in conjunction with applicable IECQ System management Basic Rules (IEC CA 01, IECQ 01-S and IECQ 02), General Rules of Procedures (IECQ 03-1) and IECQ Operational Documents (OD) as listed in normative references Clause 2. In the event of conflict between the provisions of these Rules of Procedure and any other requirements contained in referenced normative documents, the requirements of these Rules of Procedure shall apply.

IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Prodecure - Part 6: IECQ ITL Scheme - Independent Testing Laboratory Assessment Program Requirements

IECQ 03-2-2018 电子元器件的IEC质量评价体系(IECQ体系).程序规则.第2部分:IECQ批准工艺方案

This publication contains the Rules of Procedure of the Scheme of the IECQ System, hereinafter referred to as the "Rules", for the Approved Process Scheme. (IECQ Approved Process Scheme). This IECQ Approved Process Scheme Rules of Procedure provides the requirements specific to this scheme and is to be used in conjunction with applicable IECQ System management Basic Rules (IEC CA 01 + IECQ 01-S), General Rules of Procedures (IECQ 03-1) and Operational Documents (OD) as listed in normative references Clause 2. In the event of conflict between the provisions of these Rules of Procedure and any other requirements contained in referenced normative documents, the requirements of these Rules of Procedure shall apply.

IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Procedure - Part 2: IECQ Approved Process Scheme

IECQ 03-1-2018 电子元器件的IEC质量评价体系(IECQ体系).程序规则.第1部分:全部IECQ计划的通用要求

This publication contains the General Rules of Procedure for all Schemes of the IECQ System, hereinafter referred to as the "Rules". These Rules relate to the IECQ System management Basic Rules as listed in the normative references Clause 2 below, (IEC CA 01 + IECQ 01-S). This publication IECQ 03-1 shall be applicable in conjunction with the new format of IECQ Schemes rules and procedures as published, e. g. IECQ 03-4, IECQ 03-5 etc.

IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Procedure - Part 1: General Requirements for all IECQ Schemes

IECQ 03-7-2018 电子元器件的IEC质量评价体系(IECQ体系).程序规则.第7部分:IECQ伪造回避计划(IECQ AP-CAP).计划要求

IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Prodecure - Part 7: IECQ Counterfeit Avoidance Programme (IECQ AP-CAP) - Programme requirements

IECQ 03-3-2-2018 电子元器件的IEC质量评价体系(IECQ体系).程序规则.第3-2部分:IECQ批准的元件产品,相关材料和组装件计划,IECQ批准组件.汽车认证课程(IECQ AC-AQP)

IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Procedure - Part 3-2: IECQ Approved Component Products, Related Materials & Assemblies Scheme, IECQ Approved Component - Automotive Qualification Programme (IECQ AC-AQP)

IEC 60286-5:2018 RLV 自动搬运部件的包装.第5部分:矩阵托盘

Packaging of components for automatic handling - Part 5: Matrix trays

IEC 60286-5:2018 自动搬运部件的包装.第5部分:矩阵托盘

Packaging of components for automatic handling - Part 5: Matrix trays

ASTM F1190-18 中子照射无偏电子元件的标准指南

1.1 This guide strictly applies only to the exposure of unbiased silicon (Si) or gallium arsenide (GaAs) semiconductor components (integrated circuits, transistors, and diodes) to neutron radiation to determine the permanent damage in the components. Validated 1-MeV displacement damage functions codified in National Standards are not currently available for other semiconductor materials. 1.2 Elements of this guide, with the deviations noted, may also be applicable to the exposure of semiconductors comprised of other materials except that validated 1-MeV displacement damage functions codified in National standards are not currently available. 1.3 Only the conditions of exposure are addressed in this guide. The effects of radiation on the test sample should be determined using appropriate electrical test methods. 1.4 This guide addresses those issues and concerns pertaining to irradiations with neutrons. 1.5 System and subsystem exposures and test methods are not included in this guide. 1.6 The range of interest for neutron fluence in displacement damage semiconductor testing range from approximately 109 to 1016 1-MeV n/cm2 . 1.7 This guide does not address neutron-induced single or multiple neutron event effects or transient annealing. 1.8 This guide provides an alternative to Test Method 1017, Neutron Displacement Testing, a component of MIL-STD-883 and MIL-STD-750. 1.9 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. 1.10 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Standard Guide for Neutron Irradiation of Unbiased Electronic Components