共找到 1126 条与 电子元器件综合 相关的标准,共 76 页
IEC quality assessment system for electronic components (IECQ) - Guidance documents
IEC quality assessment system for electronic components (IECQ) - Rules of procedure - Part 3: Approval procedures
IEC quality assessment system for electronic components (IECQ) - Basic rules
Detail Specification: Fixed Low Power Non-Wire Wound Surface Mounting (SMD) Resistors Thin Film, Rectangular Stability Classes 0,1; 0,5; 1 Superseded by EN 140401-801:2003
Detail Specification: Fixed Low Power Non-Wire Wound Surface Mounting (SMD) Resistors Thin Film, Rectangular Stability Classes 0,1; 0,5; 1 [Superseded By: CECC EN 140401-801]
IEC quality assessment system for electronic components (IECQ) - Register of participating countries
This commercial item description covers brown kraft paper used for general wrapping applications.
ELECTRICAL COMPONENTS FOR AUTOMOTIVE VEHICLES; WATERPROOFNESS TESTS
本规范规定了电子元器件用铍青铜板带材的要求,质量保证规定、交货准备及有关规则。 本规范适用于军用电子元器件用铍青铜板带材。
Specification for copper-beryllium alloy plate and strip for use in electronic components
本规范规定了电子元器件用铍青铜线棒材的要求,质量保证规定、交货准备及有关规则。 本规范适用于军用电子元器件用铍青铜线棒材。
Specification for copper-beryllium alloy wire and bor for use in electronic components
Waveguide assemblies,millimeter,flexible,nontwistable,class 8,detail specification for
Driver of waveguide switch type 40PHX120,detail specification for
Specifies requirements for the approval and maintenance of a manufacturer's capability and the procedures for the test and release of electronic components manufactured under capability approval. Also includes requirements for generic specifications that invoke this standard.
General Procedures for Capability Approval of Electronic Components in the NECQ-System
Stripline Test for Permittivity and Loss Tangent (Dielectric Constant and Dissipation Factor) at X-Band Revision C
Stripline Test for Permittivity and Loss Tangent (Dielectric Constant and Dissipation Factor) at X-Band Revision C
Stripline Test for Complex Relative Permittivity of Circuit Board Materials to 14 GHz
Stripline Test for Complex Relative Permittivity of Circuit Board Materials to 14 GHz
This document is the preliminary specification for the CEBus Radio Frequency (RF) Physical Layer and Medium portion of the Physical Layer and Medium specifications of EIA-600. Its purpose is to present all of the information necessary for the development of a RF physical layer for a CEBus device. This is one of a series of documents covering various media that comprise the CEBus standard.
RF Physical Layer and Medium Specification
This document is the preliminary specification for the CEBus Infrared (IR) Physical Layer and Medium portion of the Physical Layer and Medium specifications of EIA-600.
IR Physical Layer and Medium Specification
This document is a generic specification within the CECC System for electronic components of assessed quality, which prescribes the requirements for the capability approval of manufacturers of Modular Electronic Units (MEUs).
Generic specification: Modular electronic units (MEUs)
This document covers guidelines for selecting electrically conductive adhesives for use in assembly of components to printed circuit boards (PCB) or similar wiring interconnect systems. The focus is on the use of adhesives as solder alternatives. The process discussion attempts to stay within the bounds of the existing solder assembly infrastructure as much as possible. Both major types of adhesives, isotropic (conducting equally in all directions) and anisotropic (unidirectional conductivity), are covered. The two major divisions of polymer adhesives, thermosets and thermoplastics, are described.
Permittivity and Loss Tangent, Parallel Plate, 1 MHz to 1.5 GHz
This test describes a procedure which may be conducted to determine if a printed wiring board is constructed to withstand the dynamic vibrational stresses that may be encountered during field service. This test method provides specific parameters for one application in order to present the proper procedures. Specific test conditions must be agreed upon by the customer and the vendor.
Test Method 2.5.17 Volume Resistivity and Surface Resistance
This test measures changes in resistance of plated-through hole barrels and internal layer connections as holes are subjected to thermal cycling. Thermal cycling is produced by the application of a current through a specific coupon configuration.
Test Coupon B - Adhesion, Passivation, Dielectric Resistance, and Outgassing
This test method is to determine the physical endurance of applied polymer solder mask to sudden changes of high and low temperature excursions to cause physical fatigue.
IPC-TM-650 Artwork Revision C
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