31.140 频率控制和选择用压电器件与介质器件 标准查询与下载
共找到 912 条与 频率控制和选择用压电器件与介质器件 相关的标准，共 61 页
Piezoelectric ceramic filters for use in electronic equipment — A specification in the IEC quality assessment system for electronic components (IECQ) — Part 1: Generic specification – Qualification ap
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- 31.140
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- 2018-11-08
- 实施
This part of IEC 63041 is applicable to piezoelectric chemical sensors mainly used in the field of biological, medical, gas and environmental sciences. It provides users with technical guidelines on biochemical sensors as well as basic knowledge of common chemical sensors.
Piezoelectric sensors - Part 2: Chemical and biochemical sensors (IEC 63041-2:2017); German version EN IEC 63041-2:2018
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- 31.140
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- L10
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- 2018-08-01
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- 2018-08-01
This part of IEC 63041 applies to piezoelectric sensors of resonator, delay-line and non acoustic types, which are used in physical and engineering sciences, chemistry and biochemistry, medical and environmental sciences, etc.
Piezoelectric sensors - Part 1: Generic specifications (IEC 63041-1:2017); German version EN IEC 63041-1:2018
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- L15
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- 2018-08-01
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- 2018-08-01
DIN EN 60122-1:2018 经质量评定的石英晶体元件. 第1部分: 总规范 (IEC 60122-1-2002+A1-2017); 德文版本 EN 60122-1-2002+A1-2018
This part of IEC 60122 specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.
Quartz crystal units of assessed quality - Part 1: Generic specification (IEC 60122-1:2002 + A1:2017); German version EN 60122-1:2002 + A1:2018
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- 31.140
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- L21
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- 2018-08-01
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- 2018-08-01
Piezoelectric filters of assessed quality — Part 3: Standard outlines and lead connections
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- 31.140
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- 2018-07-18
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Piezoelectric filters of assessed quality — Part 3: Standard outlines and lead connections
- ICS
- 31.140
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- 发布
- 2018-07-18
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Piezoelectric filters of assessed quality — Part 4: Sectional specification — Capability approval
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- 31.140
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- 2018-07-18
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Piezoelectric filters of assessed quality — Part 2: Guide to the use of piezoelectric filters — section one: Quartz crystal filters
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- 31.140
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- 发布
- 2018-07-18
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Measurement of quartz crystal unit parameters by zero phase technique in a pi-network ― Part 4: Method for the measurement of the load resonance frequency f L, load resonance resistance R L and the ca
- ICS
- 31.140
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- 发布
- 2018-07-18
- 实施
Piezoelectric filters of assessed quality — Part 4: Sectional specification — Capability approval
- ICS
- 31.140
- CCS
- 发布
- 2018-07-18
- 实施
Piezoelectric filters of assessed quality — Part 3: Standard outlines and lead connections
- ICS
- 31.140
- CCS
- 发布
- 2018-07-18
- 实施
Piezoelectric filters of assessed quality — Part 4: Sectional specification — Capability approval
- ICS
- 31.140
- CCS
- 发布
- 2018-07-18
- 实施
Piezoelectric filters of assessed quality — Part 2: Guide to the use of piezoelectric filters — section one: Quartz crystal filters
- ICS
- 31.140
- CCS
- 发布
- 2018-07-18
- 实施
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network ― Part 4: Method for the measurement of the load resonance frequency f L, load resonance resistance R L and the ca
- ICS
- 31.140
- CCS
- 发布
- 2018-07-18
- 实施
Piezoelectric filters of assessed quality — Part 2: Guide to the use of piezoelectric filters — section one: Quartz crystal filters
- ICS
- 31.140
- CCS
- 发布
- 2018-07-18
- 实施
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network ― Part 4: Method for the measurement of the load resonance frequency f L, load resonance resistance R L and the ca
- ICS
- 31.140
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- 发布
- 2018-07-18
- 实施
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
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- 31.140
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- 发布
- 2018-07-01
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Quartz crystal units of assessed quality - Generic specification
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- 31.140
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- 发布
- 2018-05-31
- 实施
- 2018-05-31
This part of IEC 61837 deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures@ and is based on IEC 61240:2016.
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
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- 31.140
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- 发布
- 2018-05-08
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- 2018-05-11
This part of IEC 62884 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method (IEC 62884-2:2017); German version EN 62884-2:2017
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- 31.140
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- L21
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- 2018-05-01
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