31.200 19.080 标准查询与下载
共找到 10 条与 相关的标准，共 1 页
Method of Test for Digital Microelectronics `6rFunctional Testing`6s
- ICS
- 31.200 19.080
- CCS
- 发布
- 1992-11-20
- 实施
Method of Test for Digital Microelectronics ( Low Level Output Voltage )
- ICS
- 31.200 19.080
- CCS
- 发布
- 1991-05-20
- 实施
Method of Test for Digital Microelectronics ( High Level Output Voltage )
- ICS
- 31.200 19.080
- CCS
- 发布
- 1991-05-20
- 实施
Method of Test for Digital Microelectronics ( Output Short Circuit Current )
- ICS
- 31.200 19.080
- CCS
- 发布
- 1991-05-20
- 实施
Method of Test for Digital Microelectronics ( High Level Input Current )
- ICS
- 31.200 19.080
- CCS
- 发布
- 1991-05-20
- 实施
Method of Test for Digital Microelectronics ( Drive Source, Dynamic )
- ICS
- 31.200 19.080
- CCS
- 发布
- 1991-05-20
- 实施
Method of Test for Digital Microelectronics ( Delay Measurements )
- ICS
- 31.200 19.080
- CCS
- 发布
- 1991-05-20
- 实施
Method of Test for Digital Microelectronics ( Terminal Capacitance )
- ICS
- 31.200 19.080
- CCS
- 发布
- 1991-05-20
- 实施
Method of Test for Digital Microelectronics ( Low Level Input Current )
- ICS
- 31.200 19.080
- CCS
- 发布
- 1991-05-20
- 实施
Method of Test for Digital Microelectronics ( Load Condition )
- ICS
- 31.200 19.080
- CCS
- 发布
- 1991-05-20
- 实施
