L04 基础标准与通用方法 标准查询与下载

IEC PAS 61906:2005 电工和电子工业产品的材料申报程序

This PAS applies to brushes for commutators and slip-rings in rotating electrical machinery. This excludes brushes of electrical appliances such as starters of automobiles and tractors, micro-appliances for household and tools, appliances for aeronautics and space, and others operating in special conditions.

Procedure for the declaration of materials in products of the electrotechnical and electronic industry

JEDEC JESD22-A104C-2005 温度循环

This specification applies to single, dual and triple chamber temperature cycling and covers component and solder interconnection testing. In single chamber cycling, the load is placed in a stationary chamber, and is heated or cooled by introducing hot or cold air into the chamber. In dual chamber cycling, the load is placed on a moving platform that shuttles between stationary chambers maintained at fixed temperatures. In triple chamber temperature cycling there are three chambers and the load is moved between them.

Temperature Cycling

DIN EN 61360-5:2005 电气元件用标准数据元素类型和相关分类模式.第5部分:EXPRESS词典模式的扩展

This part specifies the extension of the EXPRESS-Directory schema for dataelement types, component class classifications and termes defined in IEC 61360-1but which are not addressed by the information models specified in IEC 61360-2.#,,#

Standard data element types with associated classification scheme for electric components - Part 5: Extensions to the EXPRESS dictionary schema (IEC 61360-5:2004); German version EN 61360-5:2004, text English

BS EN 62226-2-1:2005 处于低频和中频电场或磁场.人体内感应产生的电流密度和内电场的计算方法.处于磁场中.2维模型

This part of IEC 62226 introduces the coupling factor K, to enable exposure assessment for complex exposure situations, such as non-uniform magnetic field or perturbed electric field. The coupling factor K has different physical interpretations depending on whether it relates to electric or magnetic field exposure. The aim of this part is to define in more detail this coupling factor K, for the case of simple models of the human body, exposed to non-uniform magnetic fields. It is thus called "coupling factor for non-uniform magnetic field". All the calculations developed in this document use the low frequency approximation in which displacement currents are neglected. This approximation has been validated in the low frequency range in the human body where parameter εω

Exposure to electric or magnetic fields in the low and intermediate frequency range - Methods for calculating the current density and internal electric field induced in the human body - Exposure to magnetic fields - 2D models

IEC 62137:2005 环境和耐用试验.区域阵列式包装件表面安装板的试验方法FBGA、BGA、FLGA、LGA、SON和QFN

This International Standard specifies the test method and guidelines for evaluating the quality and reliability of boards, solder lands, solder process and solder joints of reflow solder mounted area array type packages and peripheral terminal type packa

Environmental and endurance testing - Test methods for surface-mount boards of area array type packages FBGA, BGA, FLGA, LGA, SON and QFN

IEEE 1100-2005 电子设备供电和接地推荐操作规程

Presents recommended design, installation, and maintenance practices for electrical power and grounding (including both safety and noise control) and protection of electronic loads such as industrial controllers, computers and other information technology equipment used in commercial and industrial applications.

Recommended Practice for Powering and Grounding Electronic Equipment IEEE Emerald Book (Color Book Series)

ASTM E668-05 电子器件辐射硬化试验中测量吸收剂量用的热致发光剂量测量(TLD)系统应用的标准实施规程

Absorbed dose in a material is an important parameter that can be correlated with radiation effects produced in electronic components and devices that are exposed to ionizing radiation. Reasonable estimates of this parameter can be calculated if knowledge of the source radiation field (that is, energy spectrum and particle fluence) is available. Sufficiently detailed information about the radiation field is generally not available. However, measurements of absorbed dose with passive dosimeters in a radiation test facility can provide information from which the absorbed dose in a material of interest can be inferred. Under certain prescribed conditions, TLDs are quite suitable for performing such measurements. Note 28212;For comprehensive discussions of various dosimetry methods applicable to the radiation types and energy and absorbed dose-rate range discussed in this practice, see ICRU Reports 14, 17, 21, and 34.1.1 This practice covers procedures for the use of thermoluminescence dosimeters (TLDs) to determine the absorbed dose in a material irradiated by ionizing radiation. Although some elements of the procedures have broader application, the specific area of concern is radiation-hardness testing of electronic devices. This practice is applicable to the measurement of absorbed dose in materials irradiated by gamma rays, X rays, and electrons of energies from 12 to 60 MeV. Specific energy limits are covered in appropriate sections describing specific applications of the procedures. The range of absorbed dose covered is approximately from 102 to 10 4 Gy (1 to 106 rad), and the range of absorbed dose rates is approximately from 102 to 1010 Gy/s (1 to 1012 rad/s). Absorbed dose and absorbed dose-rate measurements in materials subjected to neutron irradiation are not covered in this practice. Further, the portion of these procedures that deal with electron irradiation are primarily intended for use in parts testing. Testing of devices as a part of more massive components such as electronics boards or boxes may require techniques outside the scope of this practice.Note 18212;The purpose of the upper and lower limits on the energy for electron irradiation is to approach a limiting case where dosimetry is simplified. Specifically, the dosimetry methodology specified requires that the following three limiting conditions be approached: (a) energy loss of the primary electrons is small, (b) secondary electrons are largely stopped within the dosimeter, and ( c) bremsstrahlung radiation generated by the primary electrons is largely lost.1.2 This standard dose not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

DLA A-A-8899 B(1) CONT. DIST.-2005 协调帮助文件模块的测试

The General Services Administration has authorized the use of this commercial item description as a replacement for Military Specifications MIL-V-16720E and MIL-V-16721D which are cancelled.

TEST OF THE ASSIST DOCUMENT COORDINATION MODULE

IEC PAS 62050:2004 手持式电子产品用元件的印制板级落锤试验方法

Board level drop test method of components for handheld electronic products

IEC PAS 61512-3:2004 批量控制.第3部分:一般和现场方法模型及表示

This PAS on Batch Control defines a model for general and site recipes; the activities that describe the use of general and site recipes within a company and across companies; a representation of general and site recipes; and a data model of general and site recipes.

Batch control - Part 3: General and site recipe models and representation

QJ 548A-2004 电子产品零件制造和机械装配通用技术要求

General technical requirements for part manufacture and mechanical assembling of electronics

JEDEC JESD22-B107C-2004 标记持久性

The tests mentioned herein are applicable for all package types. They are suitable for use in qualification and/or process monitor testing. The mechanical shear test (tape test) is recommended as an ongoing process monitor or lot acceptance test. Electrical or mechanical rejects may be used for these tests.

Marking Permanency

IEC TR 62152:2004 级联两端口术语和定义的背景

Lays the foundation for agreement on the fundamental terms and definitions to be used world wide in describing the transmission properties of a two-port or quadripole end and builds a bridge between the classical quadripole theory and the scattering matr

Background of terms and definitions of cascaded two-ports

DIN EN 62018:2004 信息技术设备的电力消耗.测量方法

Power consumption of information technology equipment - Measurement methods (IEC 62018:2003); German version EN 62018:2003

ISO/IEC 13888-1:2004 IT安全技术.抗抵赖.第1部分:概述

本部分可作为其他几部分中规定的使用密码技术的抗抵赖机制的一般模型。GB／T 17903提供的 抗抵赖机制可用于如下阶段的抗抵赖： a)证据生成； b)证据传输、存储和检索； c)证据验证。 争议仲裁不在本标准的范围之内。

IT security techniques - Non-repudiation - Part 1: General

JEDEC JEP143A-2004 固态可靠性评估和鉴定方法

Reliability is a measure of the ability of a solid state product to continue to meet data sheet specifications over time. In any population of solid state products there is a range in the time to failure, which is the time-to-failure distribution. Since the typical time-to-failure distribution will have a central characteristic in the order of hundreds or thousands of years, means must be derived to assess the time-to-failure distribution in real time. Failure mechanism models provide a physical and mathematical representation of how the time-to-failure distribution will change by changing some factor.

Solid State Reliability Assessment and Qualification Methodologies

BS CWA 14167-4:2004 CSP签名用密码模块.保护轮廓(CMCSO-PP)

Cryptographic module for CSP signing operations - Protection profile (CMCSO-PP)

BS EN 60375:2004 关于电路和磁路的规定

Conventions concerning electric and magnetic circuits

IEC 61360-5:2004 电气元器件标准数据元素类型和相关分类模式.第5部分:EXPRESS字典图表的扩展

Provides the extension of the common ISO/IEC dictionary schema for the definition of concepts which are used in IEC 61360-1 but which are not addressed by the information models specified in IEC 61360-2. Provides a formal model for data and provides, wit

Standard data element types with associated classification scheme for electric components - Part 5: Extensions to the EXPRESS dictionary schema

BS CWA 14172-5:2004 EESSI合格评定指南.安全签名创建设备

EESSI conformity assessment guidance - Secure signature-creation devices