L10 电子元件综合 标准查询与下载
共找到 914 条与 电子元件综合 相关的标准，共 61 页
This document is the product of the IPC Electrochemical Migration (ECM) Task Group. It was drafted to provide guidance regarding how the IPC-TM-650, Method 2.6.25, Conductive Anodic Filament (CAF) Resistance test can best be used for evaluating the effects of mechanical stress, laminate material fracturing, ionic contamination, moisture content prior to press lamination, and other material processing characteristics on conductive anodic filament (CAF) growth. This CAF test method provides a proven standard for determining the risk of THB failure within rather than on the surface of printed circuit boards (PCBs), typically filament formation along the boundary between the resin and laminate reinforcement.
User Guide for the IPC-TM-650, Method 2.6.25, Conductive Anodic Filament (CAF) Resistance Test (Electrochemical Migration Testing)
- ICS
- 31.190
- CCS
- L10
- 发布
- 2005
- 实施
This specification covers the general requirements for ceramic dielectric; variable capacitors intended for operation over a temperature range of -55°C to +85°C, for use in circuits where periodic adjustments are required
CAPACITORS, VARIABLE, CERAMIC DIELECTRIC, GENERAL SPECIFICATION FOR
- ICS
- 31.040.01
- CCS
- L10
- 发布
- 2005
- 实施
This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.
MICROCIRCUIT, HYBRID, LINEAR, 28 VOLT, SINGLE CHANNEL, DC/DC CONVERTER
- ICS
- 29.200
- CCS
- L10
- 发布
- 2005
- 实施
Effective 8 June 1972, MIL-DTL-3965 has been declared "Inactive for New Design" with no superseding specification. This is applicable on all acquisitons to which MIL-DTL-3965 is applied.
CAPACITOR, FIXED ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM, GENERAL SPECIFICATION FOR
- ICS
- 31.040.01
- CCS
- L10
- 发布
- 2005
- 实施
이 규격은 주로 전자 기기에 사용되는 커넥터 및 부속품의 시험 방법에 대하여 규정한다.
Method for test of connectors for use in electronic equipment
- ICS
- 33.120.30
- CCS
- L10
- 发布
- 2004-12-28
- 实施
- 2004-12-28
이 규격은 주로 전자 기기에 사용하는 커넥터의 공통적 사항 및 전자 기기용 커넥터의 품종별
General rules of connectors for use in electronic equipment
- ICS
- 31.220.10
- CCS
- L10
- 发布
- 2004-12-28
- 实施
- 2004-12-28
이 규격은 주로 전자 기기에 사용하는 저전류 회로용 로터리 스위치(이하 스위치라 한다.)의
Rotary switches for electronic equipment
- ICS
- 29.120.40
- CCS
- L10
- 发布
- 2004-12-07
- 实施
- 2004-12-07
이 규격은 주로 전자 기기 등에서 300 V 이하의 전기 회로에 사용하는 정격 전류 20
Toggle switches for use in electronic equipment
- ICS
- 29.120.40
- CCS
- L10
- 发布
- 2004-12-07
- 实施
- 2004-12-07
Standard data element types with associated classification scheme for electric components - Part 1: Definitions - Principles and methods (IEC 61360-1:2002 + A1:2003); German version EN 61360-1:2002 + A1:2004
- ICS
- 29.100.20;31.020
- CCS
- L10
- 发布
- 2004-12
- 实施
- 2004-12-01
This part specifies the EXPRESS-Dictionary schema for dataelement types, component classifications and terms defined in IEC 61360-1.#,,#
Standard data element types with associated classification scheme for electric components - Part 2: EXPRESS dictionary schema (IEC 61360-2:2002 + A1:2003); German version EN 61360-2:2002 + A1:2004, text English
- ICS
- 29.100.20;31.020
- CCS
- L10
- 发布
- 2004-12
- 实施
- 2004-12-01
이 규격은 세부 명세에 의해 요구될 때 TC 48*의 업무 범위 내에서 전자 기계적 부
Electromechanical components for electronic equipment-Basic testing procedures and measuring methods-Part 8:Conenctor tests(mechanical) and mechanical tests on contacts and terminations
- ICS
- 31.22
- CCS
- L10
- 发布
- 2004-09-17
- 实施
- 2004-09-17
이 규격에서 정의하고 있는 세부 명세에 따른 시험은 IEC TC 48*의 업무 범위 내
Electromechanical components for electronic equipment-Basic testing procedures and measuring methods-Part 7:Mechanical operating tests and sealing tests
- ICS
- 31.22
- CCS
- L10
- 发布
- 2004-09-17
- 实施
- 2004-09-17
This document defines the requirements for documenting processes to assure customers and users of given products or sets of products, that their lead content is known. This document does not contain detailed descriptions of the processes to be documented
Standard for Plans to Determine Lead Content of Electronic Components and Related Equipment
- ICS
- 49.025.05
- CCS
- L10
- 发布
- 2004-09-14
- 实施
The IPC-9194 should be used in conjunction with IPC- 9191. The IPC-9191 provides general guidelines for implementing SPC in electronics industry.
Implementation of Statistical Process Control (SPC) Applied to Printed Board Assembly Manufacture Guideline
- ICS
- 31.190
- CCS
- L10
- 发布
- 2004-09-01
- 实施
이 규격에서는 커넥터의 차폐 효과 측정 또는 부속품에 연결되고 케이블로 마감된 커넥터의
Electromechanical components for electronic equipment-Basic testing procedures and measuring methods-Part 23-3:Test 23c:Shielding effectiveness of connectors and accessories
- ICS
- 31.220.01
- CCS
- L10
- 发布
- 2004-08-31
- 实施
- 2004-08-31
이 규격은 전기 커넥터, 소켓 및 케이블 조립과 같은 상호 연결 조립품에 적용한다.
Connectors for electronic equipment-Tests and measurements-Part 25-4:Test 25d-Propagation delay
- ICS
- 31.220.10
- CCS
- L10
- 发布
- 2004-08-31
- 实施
- 2004-08-31
이 규격은 전기 커넥터, 소켓 및 케이블 조립과 같은 상호 연결 조립품에 대하여 적용한
Connectors for electronic equipment-Tests and measurements-Part 25-1:Test 25a-Crosstalk ratio
- ICS
- 31.220.10
- CCS
- L10
- 发布
- 2004-08-31
- 实施
- 2004-08-31
이 규격은 전기 커넥터, 소켓 및 케이블 조립과 같은 상호 연결 조립품에 적용한다.
Connectors for electronic equipment-Tests and measurements-Part 25-3:Test 25c-Rise time degradation
- ICS
- 31.220.10
- CCS
- L10
- 发布
- 2004-08-31
- 实施
- 2004-08-31
이 규격에서 정의하고 있는 세부 명세에 따른 시험은 IEC TC 48의 업무 범위 내에
Electromechanical components for electronic equipment-Basic testing procedures and measuring methods-Part 19:Chemical resistance tests-Section 3:Test 19c-Fluid resistance
- ICS
- 31.220.01
- CCS
- L10
- 发布
- 2004-08-24
- 实施
- 2004-08-24
이 규격에서 정의하고 있는 세부 명세에 따른 시험은 IEC TC 48의 업무 범위 내에
Electromechanical components for electronic equipment-Basic testing procedures and measuring methods- Part 20-2:Test 20b-Flammability tests-Fireproofness
- ICS
- 31.220.01
- CCS
- L10
- 发布
- 2004-08-24
- 实施
- 2004-08-24
