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This standard is Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1: General - Section 4: Test 1d: Contact protection effectiveness (scoop-proof); Corrigendum 1.
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1: General - Section 4: Test 1d: Contact protection effectiveness (scoop-proof)
Detail specification for electronic component.Directly heated negative temperature coefficient thermistor for style MF11.Assessment level E
EL4 Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of EL4 fiom manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than EIA members, whether the standard is to be used either domestically or internationally
Resistance to Soldering Heat Test Procedure for Wire and Electrical Components
Waveguide type dielectric resonators - Part 1-3 : general information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency.
Electronic Assembly Manufacturers' Qualification Profile (AQP) Company and Site Description Site Capability Snap Shot Equipment Profile (Pre-site Audit) Technology Profile Specifics Quality Profile Manufacturing History Identification of Previous Audits Financial Review (optional) MQP Electronic Data Format (See included floppy disk) Glossary of Terms
Electronic Assembly Manufacturers' Qualification Profile (AQP)
이 규격은 주로 전자 기기에 사용하는 정격 전압 500V(주파수 60Hz의 교류 또는 직류
Generic specification of switches for use in electronic equipment
This Standard covers dimensioning and tolerancing of electronic packaging as it relates to printed boards and the assembly of printed boards. The concepts defined in this Standard are derived from ASME Y14.5” 1994. Printed boards have such wide applications that there may be times where this standard does not address a specific case. In those cases, the user is referred to ASME Y14.5M 1994 for use of additional dimensioning and tolerancing concepts.
Printed Board Dimensions and Tolerances
The ball grid array (BGA) burn-in sockets of assessed quality covered by this Detail Specification have Maximum enclosure dimensions as shown in figure 2.
Detail Specification for Burn-In Sockets Used with Ball Grid Array Devices for Use in Electronic Equipment
This Sectional Specification relates to battery holders of assessed quality. The purpose of this specification is to provide a means of interchangeability between qualified devices and compatibility between the board and the battery holder and to provide
Sectional Specification for Battery Holders for Use in Electronic Equipment
The ball grid array (BGA) burn-in sockets of assessed quality covered by this Detail Specification shall have
Blank Detail Specification for Burn-In Sockets Used with Ball Grid Array Devices for Use in Electronic Equipment
The cylindrical battery holders of assessed quality covered by this Detail Specification have
Detail Specification for Cylindrical Battery Holders, Standard Profile, for Use in Electronic Equipment
To model electric component data and to define an interchange format for that data which is independent of the component supplier.
Pinnacles Component Information Standard 1.2. The SGML declaration and SGML document type definitions (DTDs)
This part of IEC 60512, when required by the detail specification, is used for testing electromechanical components within the scope of IEC technical committee 48. This test may also be used for similar components when specified in a detail specification. The object of this test is to detail a standard method to assess the ability of a connector to withstand specified flame and vibration during a 20 min exposure by providing specified electrical performance for the first 6 min of exposure and preventing the flame from penetrating the fireproof bulkhead on which the connector is mounted throughout the test.
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 20-2: Test 20b - Flammability tests - Fireproofness
This standard establishes requirements and other considerations
Voluntary Safety Standard for Electrically Heated Process Equipment
This specification defines guidelines for selecting core constructions in terms of fiberglass fabric style and configuration for use in multilayer PWB applications. Each core construction is given a registration number for ordering purposes. Every effort shall be made to periodically review the construction guideline and include or exclude constructions based on current data.
Guidelines for Selecting Core Constructions for Multilayer Printed Wiring Board Applications Supersedes IPC-CC-110A
This drawing and MIL-PRF-39018 describes the complete requirements for aluminum oxide, electrolytic capacitors.
CAPACITORS, FIXED, ELECROLYTIC, POLARIZED, ALUMINUM OXIDE, SINGLE END MOUNTING
This standard specifies data formats used to describe printed board assembly in-circuit testing methodologies. These formats may be used for transmitting information between printed circuit board designers and printed board manufacturers. The formats are also useful when the manufacturing cycle includes computer-aided processes and numerical control machines.
Sectional Requirements for Implementation of Bare Board Product Electrical Testing Data Description [BDTST]
This standard specifies data formats used to describe printed board assembly in-circuit testing methodologies. These formats may be used for transmitting information between printed board designers, board fabricators, and assembly manufacturers. The formats are also useful when the manufacturing cycle includes computer-aided processes and numerical control machines.
Sectional Requirements for Implementation of Assembly In-Circuit Testing Data Description [ASEMT]
This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.
MICROCIRCUIT, LINEAR, 8-BIT, ANALOG-TO-DIGITAL CONVERTER, WITH TRACK/HOLD, MONOLITHIC SILICON
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