L10 电子元件综合 标准查询与下载

KS C 6424-1999 电子设备用可变电阻器试验法

이 규격은 주로 전자 기기에 사용하는 가변 저항기(이하 저항기라 한다.)의 시험 방법에 대

Test methods of potentiometers for use in electronic equipment

NF C93-013:1999 自动运输用零部件的包装.第1部分:带轴向引线的元器件在连续胶带上的胶带包装

Packaging of components for automatic handling - Part 1 : tape packaging of components with axial leads on continuous tapes.

NF C93-111:1999 自动运输用零部件的包装.第4部分:封装在 E 型和 G 型包装件的电子零部件用胶条盒

Packaging of components for automatic handling - Part 4 : stick magazines for electronic components encapsulated in packages of form E and G.

IEC 61726:1999 电缆配件、电缆、连接器和无源微波元件.利用混响室法测量滤屏衰减

This International Standard describes the measurement of screening attenuation by the reverberation chamber test method, sometimes named mode stirred chamber, suitable for virtually any type of microwave component and having no theoretical upper frequency limit. It is only limited toward low frequencies due to the size of the test equipment, which is frequency dependent and is only one of several methods of measuring screening attenuation. For the purpose of this standard, examples of microwave components are waveguides, phase shifters, diplexers/multiplexers, power dividers/combiners etc.

Cable assemblies, cables, connectors and passive microwave components - Screening attenuation measurement by the reverberation chamber method

SJ/T 11113-1999 电子元器件详细规范.低功率非线绕固定电阻器.RJ13型金属膜固定电阻器.评定水平E

Detail specification for electronic components.Fixed low-power non-wirwound resistors.Type RJ13 metal film fixed resistors.Assessment level E

BS DD ENV 50247-1:1999 尖顶元件信息标准1.2.PCIS标签库

To model electric component data and to define an interchange format for that data which is independent of the computer supplier.

Pinnacles Component Information Standard 1.2. The PCIS tag library

JIS C 0445:1999 设备端子和一些带标记导线终端的标记方法,包括字母数字顺序系统的一般规则

この規格は，抵抗器，ヒューズ.リレー，接触器，変圧器，回転機などのような電気機器の端子の識別及び表示に対して適用する。また，識別指定された電線端末の識別にも適用する。

Identification of equipment terminals and of terminations of certain designated conductors, including general rules for an alphanumeric system

NF C93-619-1-1:1999 使用波导型电介质谐振器的过滤器.第1部分:一般信息、标准值和试验条件.第1部分:一般信息和标准值

Filters using waveguide type dielectric resonators. Part 1 : general information, standard values and test conditions. Section 1 : general information and standard values.

ECA EIA-740-1999 小型88.9 mm (3.5 in)光盘驱动器规范

This standard defines the dimensions and interconnections of 88.9 mm (3.5 in) small form factor disk drives.The purpose of this standard is to define the external aracteristics of small form factor disk drives so that products from different vendors may

Specification for Small Form Factor 88.9 mm (3.5 in) Disk Drives

ECA EIA-364-02C-1999 TP-02C电子连接器的空气泄露测试程序

This test procedure details a standard method to determine the integrity of the seal of the shell,insert and contact interfaces in an electrical connector.

TP-02C Air Leakage Test Procedure for Electrical Connectors

UL 1692-1999 聚合材料.卷材

Describes the various test procedures and the use of polymeric insulation systems and parts that are used within motors, contactors, relays, solenoids, transformers, and the like. These requirements do not cover the specific insulation systems that are covered under American National Standard for Systems of Insulating Materials, ANSI/UL 1446-1991

UL Standard for Safety Polymeric Materials - Coil Forms Second Edition; Reprint with Revisions Through and Including 06/04/2004

ECA EIA-364-03B-1999 TP-03B 电子连接器的高度沉浸测试程序

This standard establishes a test method to determine the abiity of the connector-to-wire and interface area seals of a mated connector assembly to perform satisfactorily during and subsequent to simulated rapid descents from high altitude with attendant m

TP-03B Altitude Immersion Test Procedure for Electrical Connectors

ECA EIA-364-54A-1999 TP-54A电子连接器、接触和插座导磁性试验程序

This standard applies to electrical connectors, contacts and sockets.

TP-54A Magnetic Permeability for Test Procedure for Electrical Connectors, Contacts, and Sockets

IPC J-STD-035-1999 非气密封装电子元件声学显微镜

This test method defines the procedures for performing acoustic microscopy on non-hermetic encapsulated electronic components. This method provides users with an acoustic microscopy process flow for detecting defects non-destructively in plastic packages while achieving reproducibility.

Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components

IPC 9503-1999 非集成电路元件潮湿敏感度分类

The purpose of this standard is to identify the moisture sensitivity classification level of passive surface mount devices and through-hole components, subjected to reflow soldering, so that they can be properly packaged, stored, and handled to avoid subsequent thermal/mechanical damage during the assembly solder reflow attachment and/or repair operation.

Moisture Sensitivity Classification for Non-IC Components

IPC 1902-1999 印刷电路国际展览中心60097采用网格系统

This International Standard relates to grid systems for printed circuits to ensure compatibility between the printed circuits and parts to be mounted on them at the intersections of the grid.

Grid Systems for Printed Circuits IEC 60097 Adoption

IPC QE-605A-1999 印制电路板质量评价手册修订版A

IPC Standards and Publications are designed to serve the public interest through

Printed Board Quality Evaluation Handbook Revision A

IPC IPC ENVIRONMENT-1999 印刷电路板业的环境最佳做法指南

As we enter the next millennium concerns for our environment and industry’s need to minimise its environmental impact will continue to grow in importance, not only because of increasing public concerns but also because of the financial impact. As a result, environmental best practices are no longer regarded by progressive businesses as being merely admirable but impractical ideals. Instead, they are now viewed as important and attainable necessities for today’s modern companies. Indeed, for the UK PCB industry to remain competitive in the face of increasingly aggressive global competition, our own manufacturers must maximise the benefits obtainable by adopting sound environmental best practices.

Printed Circuit Board Industry an Environmental Best Practice Guide

NAVY MIL-G-7818 (2)-1999 补偿式电容器燃油量应变计

This amendment fomis a part of MIL-G-78 18, dated 26 November 195 1, and is approved for use by all Departments and Agencies of the Department of Defense.

GAGE, FUEL QUANTITY, CAPACITOR TYPE, COMPENSATED, GENERAL SPECIFICATION FOR

ASTM F1190-99 未加偏压的电子元件的中子照射标准指南

1.1 This practice applies to the exposure of unbiased silicon (Si) or gallium arsenide (GaAs) semiconductor components to neutron radiation from a nuclear reactor source. Only the conditions of exposure are addressed in this practice. The effects of radiation on the test sample should be determined using appropriate electrical test methods. 1.2 System and subsystem exposures and test methods are not included in this practice. 1.3 This practice is applicable to irradiations conducted with the reactor operating in either the pulsed or steady-state mode. The practical limits for neutron fluence ([phi]eq,1MeV,Si or [phi]eq,1MeV,GaAs) in semiconductor testing range from approximately 10 to 10 16 n/cm . 1.4 This practice addresses those issues and concerns pertaining to irradiations with neutrons of energies greater than 10 keV. 1.5 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Guide for Neutron Irradiation of Unbiased Electronic Components