L10 电子元件综合 标准查询与下载



共找到 914 条与 电子元件综合 相关的标准,共 61

Details a standard test method to measure the force and/or torque required to fully engage or separate mating componenets, including the effect of any device that assists the engaging/separating operations. Replaces clause 1 of IEC 512-7 (Test 13a).

Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 13: Mechanical operating tests - Section 1: Test 13a: Engaging and separating forces

ICS
31.220.01
CCS
L10
发布
1996-11
实施
2006-02-15

Fixed inductors for use in electronic and telecommunication equipment - Marking codes

ICS
01.070;29.180
CCS
L10
发布
1996-11
实施
2005-06-16

Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 11: Climatic tests - Section 14: Test 11p - Flowing single gas corrosion test

ICS
31.220.01
CCS
L10
发布
1996-10
实施
2003-08-06

This document defines the means for review and registration of new technologies pertaining to automated handihg of electronic components.

Electronic Industries Association - Automated Component Handling Committee - Guidelines and Procedures for Registration of New Technologies for Automated Component Handling for Publication in ACH-2000

ICS
49.025.05
CCS
L10
发布
1996-09-01
实施

Guidance document: Use and application of plastic encapsulated devices; German version CECC 00808:1996

ICS
31.020
CCS
L10
发布
1996-09
实施

Type HTP009A and HTP017A radio frequency strip-line circulators detail specification for

ICS
31.020
CCS
L10
发布
1996-08-30
实施
1997-01-01

General specification for a.c.thin film electroluminescent matrix display devices

ICS
31.020
CCS
L10
发布
1996-08-30
实施
1997-01-01

Methods of measurement for a.c.thin film electroluminescent matrix display devices

ICS
31.020
CCS
L10
发布
1996-08-30
实施
1997-01-01

Driver of waveguide switch type 40PHX90,detail specification for

ICS
31.020
CCS
L10
发布
1996-08-30
实施
1997-01-01

Generic Specification for Sockets for Use in Electronic Equipment

Generic Specification for Sockets for Use in Electronic Equipment

ICS
49.025.05
CCS
L10
发布
1996-08-01
实施

The pin grid array (PGA) sockets of assessed quality covered by this detail specification have:- Maximum enclosure dimensions as shown in figure 1.- A working voltage not xceeding 250 volts (rms).

Detail Specification for Mechanically Actuated (Zero and Low Insertion Force) Sockets for Pin Grid Array Devices with 2.54 mm X 2.54 mm (0.1 in X 0.1 in) Spacing for Use in Electronic Equipment

ICS
49.025.05
CCS
L10
发布
1996-08-01
实施

Object of this test is to detail an standard method to assess the mechanical strength of solderless connections including integrated strain relief features. Should be used in conjunction with IEC 512-1.

Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 16: Mechanical tests on contacts and terminations - Section 20: Test 16t: Mechanical strength (wired termination of solderless connections)

ICS
31.220.01
CCS
L10
发布
1996-08
实施

Implementation of CECC 00804:1996 Harmonized system of quality assessment for electronic components Interpretation of 'EN ISO 9000 : 1994' Reliability aspects for electronic components SECTION A - GUIDE INTRODUCTION 0.1 General introduction to CECC 00 804 0.2 Application of CECC 00 804 by component manufacturers and specialist contractors 0.3 Application of CECC 00 804 by other organisations 0.4 Application of CECC 00 804 by auditing bodies GUIDANCE 1 Management responsibility 2 Quality system 3 Contract review 4 Design control 5 Documentation control 6 Purchasing 7 Purchaser supplied product 8 Identification and traceability 9 Process control 10 Inspection and test 11 Inspection, measurement and test equipment 12 Inspection and test status 13 Control of non-conforming products 14 Corrective action 15 Handling, storage, packaging and delivery 16 Quality records 17 Audits 18 Training 19 Servicing 20 Statistical techniques SECTION B - CHECK LIST INTRODUCTION CHECK LIST QUESTIONS

Harmonized system of quality assessment for electronic components - Interpretation of 'EN ISO 9000:1994': Reliability aspects for electronic components

ICS
03.120.10;31.020
CCS
L10
发布
1996-07-15
实施
1996-07-15

Surface Insulation Resistance (SIR) testing has been with the electronics industry since the advent of the transistor and printed circuit board. It has been used as a tool for: incoming inspection; materials investigations and qualifications; quality conformance; prediction of long-term failure mechanisms; and as a predictive tool for estimated service life.

Surface Insulation Resistance Handbook

ICS
31.190
CCS
L10
发布
1996-07-01
实施

This document covers guidelines for selecting electrically conductive adhesives for use in assembly of components to printed circuit boards (PCB) or similar wiring interconnect systems. The focus is on the use of adhesives as solder alternatives. The process discussion attempts to stay within the bounds of the existing solder assembly infrastructure as much as possible. Both major types of adhesives, isotropic (conducting equally in all directions) and anisotropic (unidirectional conductivity), are covered. The two major divisions of polymer adhesives, thermosets and thermoplastics, are described.

Guidelines for Electrically Conductive Surface Mount Adhesives

ICS
31.190
CCS
L10
发布
1996-07-01
实施

This document establishes design concepts, guidelines, and procedures intended to promote appropriate ‘Design for Reliability (DfR)’ procedures and to ensure reliable printed wiring assembly (PWA) characteristics. The major focus of the information presented is directed toward those PWAs that have surface mount (SM) components, either totally, or intermixed with through-hole components, mounted on one or both sides of the mounting structure.

Design Guidelines for Reliable Surface Mount Technology Printed Board Assemblies

ICS
31.190
CCS
L10
发布
1996-07-01
实施

Microwave assembly.detail specification for model WFZ817 voltage controlled oscillator

ICS
31.020
CCS
L10
发布
1996-06-14
实施
1996-10-01

General specification for pulse modulation tubes

ICS
31.020
CCS
L10
发布
1996-06-14
实施
1996-10-01

The purpose of this procedure is to determine the presence of mechanical damage, wearthrough,and other gross defects in the contact finish. Most contact finishes are intended to be protective, and the presence of gross defects in the finish indicates a se

TP-85 General Test Procedure for Assessing Wear and Mechanical Damage Testing of Contact Finishes for Electrical Connectors

ICS
49.025.05
CCS
L10
发布
1996-06-01
实施

The objective of this test procedure is to determine the &&venes of polarizationlcoding keys when a connector pair is misregistered (improperly mated).

TP-86 Polarizing/Coding Key Overstress Test Procedure for Electrical Connectors and Sockets

ICS
49.025.05
CCS
L10
发布
1996-06-01
实施



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