L13 电阻器 标准查询与下载

SJ 20603-1996 片式电阻器用电阻浆料规范

Specification for resistance paste for use in chip resistors

SJ 51782/2-1996 MYG02型压敏电阻器详细规范

Detail specification for style MYG02 varistors

SJ 51929/2-1996 RJ24型高稳定金属膜固定电阻器详细规范

Resistors,fixed,metal film,high stability,style RJ24,Detail specification for

DIN EN 140102:1996 空白详细规范:低功率非绕线固定电阻.评定等级 M

A blank detail specification is a supplementary document of the Sectional Specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements may not be considered as being in accordance with CECC not shall they be to described.

Blank detail specification: Fixed low power non-wirewound resistors - Assessment level M; German version EN 140102:1996

DIN EN 140104:1996 空白详细规范:低功率非绕线固定电阻.评定等级 SB和SC

A blank detail specification is a supplementary document of the sectional specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements may not be considered as being in accordance with CECC not shall they be to described.

Blank detail specification: Fixed low power non-wirewound resistors - Assessment levels: SB and SC; German version EN 140104:1996

DIN EN 140103:1996 空白详细规范:低功率非绕线固定电阻.评定等级 P

A blank detail specification is a supplementary document of the sectional specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements may not be considered as being in accordance with CECC not shall they be to described.

Blank detail specification: Fixed low power non-wirewound resistors - Assessment level: P; German version EN 140103:1996

JIS C 5260:1996 电子设备用电位计的通用规则

この規格は，主として電子機器に用いる可変抵抗器(以下。抵抗器という。)の品目別通則であり，祇抗器の共通的事項並びに抵抗器の品種別通則(以下,品種別通則という。)及ぴ抵抗器め個別規格(以下,個別規格という。)に規定する事項の基準について規定する。

General rules of potentiometers for use in electronic equipment

ASTM F1711-96 使用四点探测法测定专业平板显示器用薄膜导线的薄膜电阻的标准规程

1.1 This practice describes methods for measuring the sheet electrical resistance of sputtered thin conductive films deposited on large insulating substrates, used in making flat panel information displays. It is assumed that the thickness of the conductive thin film is much thinner than the spacing of the contact probes used to measure the sheet resistance. 1.2 This standard is intended to be used with Test Method F 390. 1.3 Sheet resistively in the range of 0.5 to 5000 ohms per square may be measured by this practice. The sheet resistance is assumed uniform in the area being probed. 1.4 This practice is applicable to flat surfaces only. 1.5 Probe pin spacings of 1.5 mm to 5.0 mm, inclusive (0.059 to 0.197in. inclusive) are covered by this practice. 1.6 The method in this practice is potentially destructive to the thin film in the immediate area in which the measurement is made. Areas tested should thus be characteristic of the functional part of the substrate, but should be remote from critical active regions. The method is suitable for characterizing dummy test substrates processed at the same time as substrates of interest. 1.7 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only. 1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe

ASTM F1711-96(2002) 使用四点探测法测定专业平板显示器用薄膜导线的薄膜电阻的标准规程

1.1 This practice describes methods for measuring the sheet electrical resistance of sputtered thin conductive films deposited on large insulating substrates, used in making flat panel information displays. It is assumed that the thickness of the conductive thin film is much thinner than the spacing of the contact probes used to measure the sheet resistance.1.2 This standard is intended to be used with Test Method F 390.1.3 Sheet resistivity in the range 0.5 to 5000 ohms per square may be measured by this practice. The sheet resistance is assumed uniform in the area being probed.1.4 This practice is applicable to flat surfaces only.1.5 Probe pin spacings of 1.5 mm to 5.0 mm, inclusive (0.059 to 0.197 in inclusive) are covered by this practice.1.6 The method in this practice is potentially destructive to the thin film in the immediate area in which the measurement is made. Areas tested should thus be characteristic of the functional part of the substrate, but should be remote from critical active regions. The method is suitable for characterizing dummy test substrates processed at the same time as substrates of interest.1.7 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe

SJ 51782/1-1995 MYGJ1型压敏电阻器详细规范

Detail specification for varistores for type MYGJ1

JIS C 6445:1995 线绕电位计

この規格は，主に電気通信機器及び電子機器に用いる巻線形可変抵抗器(以下,抵抗器という。)について規定する。

Wirewound potentiometers

JIS C 6443:1995 一般用途碳电位计

この規格は，主に電子機器に用いる普通級炭素糸可変抵抗器(以下,抵抗器という。)について規定する。

Carbon potentiometers for general use

BS EN 140211:1995 电气元器件质量评定协调体系规范.空白详细规范.固定功率电阻.能力鉴定

Specification for Harmonized system of quality assessment for electronic components Blank detail specification Fixed power resistors —Capability approval 1 General 2 Inspection requirements

Specification for harmonized system of quality assessment for electronic components - Blank detail specification: fixed power resistors - Capability approval

UL 1676-1995 放电电路电阻器

Discharge path resistors

SJ 51929.7-1995 RJ55型高稳定金属膜固定电阻器详细规范

本规范适用于RJ55型高稳定金属膜固定电阻器。

Resistors,fixed,metal film,high stability,style RJ55,detail specification for

SJ 51929.4-1995 RJ52型高稳定金属膜固定电阻器详细规范

本规范适用于RJ52型高稳定金属膜固定电阻器。

Resistors,fixed,metal film,high stability,style RJ52,detail specification for

SJ 51929.5-1995 RJ53型高稳定金属膜固定电阻器详细规范

本规范适用于RJ53型高稳定金属膜固定电阻器。

Resistors,fixed,metal film,high stability,style RJ53,detail specification for

SJ 51929.6-1995 RJ54型高稳定金属膜固定电阻器详细规范

本规范适用于RJ54型高稳定金属膜固定电阻器。

Resistors,fixed,metal film,high stability,style RJ54,detail specification for

SJ 51929.8-1995 RJ56型高稳定金属膜固定电阻器详细规范

本规范适用于RJ56型高稳定金属膜同定电阻器。

Resistors,fixed,metal film,high stability,style RJ56,detail specification for

SJ/T 10617-1995 电子元器件详细规范.低功率非线绕固定电阻器.RT13型碳膜固定电阻器.评定水平E

本标准适用于RT13型碳膜固定电阻器，它是按照GB 5731-1985/IEC 115-2-1(1982)/QC 400101《电子设备用固定电阻器 第二部分：空白详细规范：低功率非线绕固定电阻器 评定水平E》制定的，符合GB/T5729/IEC115-1(1982)/QC400000《电子设备用固定电阻器 第一部分：总规范》和GB5730-1985/IEC115-2(1982)/QC400100《电子设备用固定电阻器 第二部分：分规范：低功率非线绕固定电阻器》的要求。 中国电子元器件质量认证委员会标准机构是中国电子技术标准化研究所。

Detail specification for electronic components.Fixed low-power non-wirwound fixed resistors.Type RT13 carbon film fixed resistors.Assessment level E