L21 石英晶体、压电元件 标准查询与下载

JIS C 6710:2007 晶体控制振荡器的一般规范

この規格は，水晶発振器の品目別通則であって，水晶発振器に対する試験方法及び一般的要求事項について規定する。IEC電子部品品質評価システム(IECQ)に基づく能力認証及び/又は品質 認証にも適用する。

Generic specification of crystal controlled oscillators

JIS C 6701:2007 石英晶体元件的一般规范

この規格は，能力認証及び/又は品質認証を適用する水晶振動子に対する試験方法及び一般要求事項について規定する。

Generic specification of quartz crystal units

IEC TS 61994-1:2007 频率控制和选择用压电和介电装置.术语.第1部分:压电和介电谐振器

This technical specification gives the terms and definitions for piezoelectric and dielectric resonators representing the present state-of-the-art, which are intended for use in the standards and documents of IEC technical committee 49.

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators

BS EN 60679-1:2007 经质量评定的石英晶体振荡器.总规范

This part of IEC 60679 specifies the methods of test and general requirements for quartz crystal controlled oscillators of assessed quality using either capability approval or qualification approval procedures.

Quartz crystal controlled oscillators of assessed quality. Generic specification

DLA DSCC-DWG-94023 REV B-2007 微型表面安装石英晶体单位

This drawing describes the requirements for a miniature quartz crystal unit, surface mount, with a frequency range of 10 to 2,100 kilohertz, supplied to the requirements of this drawing specified herein.

CRYSTAL UNIT, QUARTZ, MINIATURE, SURFACE MOUNT

DLA DSCC-DWG-94024 REV B-2007 微型印刷电路安装石英晶体单位

This drawing describes the requirements for a miniature quartz crystal unit, printed circuit mount, with a frequency range of 10 to 2,100 kilohertz, supplied to the requirements of this drawing specified herein.

CRYSTAL UNIT, QUARTZ, MINIATURE, PRINTED CIRCUIT MOUNT

ARMY MIL-PRF-3098 J-2007 一般规格石英稳定器

This specification covers the general requirements for quartz crystal units.

CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR

BS EN 60444-9:2007 石英晶体元件参数测量.压电晶体元件寄生振荡测量

This part of IEC 60444 describes two methods for determining the spurious (unwanted) modes of piezoelectric crystal resonators. It extends the capabilities and improves the reproducibility and accuracy compared to previous methods. The previous methods described in IEC 60283 (1968) were based on the use of a measuring bridge, which applies to non-traceable components such as variable resistors and a hybrid transformer, which are no longer commercially available. Method A (Full parameter determination) Full parameter determination allows the determination of the equivalent parameters of the spurious resonances and is based on the methods described in IEC 60444-5 using the same measurement equipment. It is the preferred method, which can be applied to the measurement of low and medium impedance spurious resonances up to several kΩ. Method B (Resistance determination) Resistance determination should be used for the determination of high impedance spurious resonances as specified, for example for certain filter crystals. It uses the same test equipment as method A in conjunction with a test fixture, which consists of commercially available microwave components such as a 180° hybrid coupler and a 10 dB attenuator, which are well-defined in a 50 Ω environment. This method is an improvement to the “reference method” of the obsolete IEC 60283.

Measurement of quartz crystal unit parameters - Measurement of spurious resonances of piezoelectric crystal units

GJB 2138/2-2007 JA547型石英晶体谐振器详细规范

本规范规定了 JA547 型石英晶体谐振器（以下简称谐振器）的详细要求、质量保证规定和交货准备。 本规范适用于 JA547 型石英晶体谐振器的生产、试验、采购和验收。

Detail specincation for JA547 quartz crystal resonators

GJB 2138/3-2007 JA557型石英晶体谐振器详细规范

本规范规定了 JA557 型石英晶体谐振器（以下简称谐振器）的详细要求、质量保证规定和交货准备。 本规范适用于 JA557 型石英晶体谐振器的生产、试验、采购和验收。

Detail specincation for JA557 quartz crystal resonators

GJB 2138/1-2007 JA533型石英晶体谐振器详细规范

本规范规定了 JA533 型石英晶体谐振器（以下简称谐振器）的详细要求、质量保证规定和交货准备。 本规范适用于 JA533 型石英晶体谐振器的生产、试验、采购和验收。

Detail specincation for JA533 quartz crystal resonators

IEC 60679-1:2007 经质量评定的石英晶体振荡器.第1部分:总规范

This part of IEC 60679 specifies the methods of test and general requirements for quartz crystal controlled oscillators of assessed quality using either capability approval or qualification approval procedures.

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

IEC 60444-9:2007 石英晶体元件参数测量.第9节:压电晶体元件寄生振荡测量

This part of IEC 60444 describes two methods for determining the spurious (unwanted) modes of piezoelectric crystal resonators. It extends the capabilities and improves the reproducibility and accuracy compared to previous methods. The previous methods described in IEC 60283 (1968) were based on the use of a measuring bridge, which applies to non-traceable components such as variable resistors and a hybrid transformer, which are no longer commercially available. Method A (Full parameter determination) Full parameter determination allows the determination of the equivalent parameters of the spurious resonances and is based on the methods described in IEC 60444-5 using the same measurement equipment. It is the preferred method, which can be applied to the measurement of low and medium impedance spurious resonances up to several kQ. Method B (Resistance determination) Resistance determination should be used for the determination of high impedance spurious resonances as specified, for example for certain filter crystals. It uses the same test equipment as method A in conjunction with a test fixture, which consists of commercially available microwave components such as a 180° hybrid coupler and a 10 dB attenuator, which are well-defined in a 50 Q environment. This method is an improvement to the "reference method" of the obsolete IEC 60283.

Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units

DLA QPL-3098-91-2006 石英晶体装置.一般规格

PLUS (+) FREQUENCY TO BE ADDED TO ALL M3098 PART NUMBERS.

CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR

SJ 20965-2006 光电器件用氧化铍陶瓷载体规范

本规范规定了光电器件用氧化铍陶瓷载体的要求、质量保证规定、交货准备等。 本规范适用于光电器件用氧化铍陶瓷载体（以下简称载体）。

Specification for beryllia ceramic carrier used for photocon devices

BS EN 62276:2005 表面声波(SAW)装置用单晶薄片.规范和测量方法

This International Standard applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

NF C93-616:2006 表面声波装置用单晶片.规范和测量方法

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods.

BS EN 61019-2:2005 表面声波谐振器.使用指南

SAW resonators are now widely used in a variety of applications: VCR RF-converters, CATV local oscillators, measuring equipment, remote control and so on. While SAW resonators are also applied to narrow bandwidth filters, the scope of this part of IEC 61019 is limited to SAW resonators for oscillator applications It is not the aim of this guide to explain theory, nor to attempt to cover all the eventualities which may arise in practical circumstances. This guide draws attention to some of the more fundamental questions, which should be considered by the user before he places an order for a SAW resonator for a new application. Such a procedure will be the user's insurance against unsatisfactory performance. Standard specifications, such as those of the IEC of which this guide forms a part, and national specifications or detail specifications issued by manufacturers, will define the available combinations of resonance frequency, quality factor, motional resistance, parallel capacitance, etc. These specifications are compiled to include a wide range of SAW resonators with standardized performances. It cannot be over-emphasized that the user should, wherever possible, select his SAW resonators from these specifications, when available, even if it may lead to making small modifications to his circuit to enable the use of standard resonators. This applies particularly to the selection of the nominal frequency.

Surface acoustic wave (SAW) resonators. Guide to the use

JJG 181-2005 石英晶体频率标准

本规程适用于石英晶体频率标准(包括GPS控制的石英晶体频率标准)的首次检定、后续检定和使用中检验。

Quartz Crystal Frequency Standards

NF C93-632:2005 人造石英晶体.规范和使用指南

Synthetic quartz crystal - Specifications and guide to the use