L21 石英晶体、压电元件 标准查询与下载



共找到 479 条与 石英晶体、压电元件 相关的标准,共 32

Specifies the terms and definitions for single crystal wafers applied for surface acoustic wave (SAW) devices representing the state of the art, which are intended for use in the standards and documents of IEC technical committee 49.

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for Surface Acoustic Wave (SAW) devices

ICS
01.040.31;31.140
CCS
L21
发布
2005-05
实施

This International Standard applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.

Single crystal wafers for surface acoustic wave (SAW) device application - Specifications and measuring methods

ICS
31.140
CCS
L21
发布
2005-05
实施
2005-06-01

Gives practical guidance to the use of surface acoustic wave (SAW) resonators which are used in telecommunications, radio equipments and consumer products. Is to be used in conjunction with IEC 61019-1. The features of SAW resonators are small size, ligh

Surface acoustic wave (SAW) resonators - Part 2: Guide to the use

ICS
31.140
CCS
L21
发布
2005-05
实施
2005-05-13

This International Standard applies to synthetic quartz single crystals intended for manu-facturing piezoelectric elements for frequency control and selection.

Synthetic quartz crystal - Specifications and guide to the use

ICS
31.140
CCS
L21
发布
2005-04-01
实施
2005-04-01

This part of IEC 61338 applies to waveguide type dielectric resonators of assessed quality using either capability approval or qualification approval procedures. It also lists the test and measurement procedures which may be selected for use in detail specifications for such resonators.

Waveguide type dielectric resonators. Generic specification

ICS
31.140;33.120.10
CCS
L21
发布
2005-03-10
实施
2005-03-10

This part of IEC 61019 specifies the methods of test and general requirements for SAW resonators using either capability approval or qualification approval procedures of the IECQ system.

Surface acoustic wave (SAW) resonators - Generic specification

ICS
31.140
CCS
L21
发布
2005-03-10
实施
2005-03-10

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4 : hybrid enclosure outlines.

ICS
31.240
CCS
L21
发布
2005-03-01
实施
2005-03-05

This part of IEC 61837 specifies the outline drawings for surface mounted piezoelectric devices with hybrid enclosure outlines.

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines (IEC 61837-4:2004); German version EN 61837-4:2004

ICS
31.240
CCS
L21
发布
2005-03
实施
2005-03-01

Measurement of quartz crystal unit parameters - Part 8 : test fixture for surface mounted quartz crystal units.

ICS
31.140
CCS
L21
发布
2005-02-01
实施
2005-02-05

Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules.

ICS
31.140
CCS
L21
发布
2005-01-01
实施
2005-01-20

This part of IEC 61837 specifies the outline drawings for surface mounted piezoelectric devices with hybrid enclosure outlines.

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Hybrid enclosure outlines

ICS
31.240
CCS
L21
发布
2004-12-13
实施
2004-12-13

Applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control and selection.

Synthetic quartz crystal - Specifications and guide to the use

ICS
31.140
CCS
L21
发布
2004-12
实施
2008-11-17

Specifies the methods of test and general requirements for SAW resonators.

Surface acoustic wave (SAW) resonators - Part 1: Generic specification

ICS
31.140
CCS
L21
发布
2004-11
实施
2004-11-03

This standard applies to activity and frequency dips for quartz crystal units over a temperature range.

Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units (IEC 60444-7:2004); German version EN 60444-7:2004

ICS
31.140
CCS
L21
发布
2004-11
实施
2004-11-01

This standard applies to activity and frequency dips for quartz crystal units over a temperature range.

Measurement of quartz crystal unit parameters - Measurement of activity and frequency dips of quartz crystal units

ICS
31.140
CCS
L21
发布
2004-09-03
实施
2004-09-03

This part of IEC 60862 specifies the outline drawings for surface acoustic wave (SAW) filters with leaded enclosures.

Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines (IEC 60862-3:2003); German version EN 60862-3:2003

ICS
31.160
CCS
L21
发布
2004-08
实施
2004-08-01

Describes the procedure for measuring and evaluating activity and frequency dips for quartz crystal units over a temperature range.

Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units

ICS
31.140
CCS
L21
发布
2004-04
实施
2004-04-08

Specifies the terms and definitions for piezoelectric and dielectric oscillators representing the present state-of-the-art, which are intended for use in the standards and documents of IEC technical committee 49.

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 3: Piezoelectric and dielectric oscillators

ICS
01.040.31;31.140
CCS
L21
发布
2004-03
实施

This standard specifies the methods of test and general requirements for SAW filters of assessed quality using either capability approval or qualification approval procedures.

Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification (IEC 60862-1:2003); German version EN 60862-1:2003

ICS
31.160
CCS
L21
发布
2004-03
实施
2004-03-01

This part of IEC 60444 explains the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent electrical circuit parameters of a leadless surface mounted quartz crystal units using zero phase technique as specified in IEC 60444-4 and IEC 60444-5.

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2003); German version EN 60444-8:2003

ICS
31.140
CCS
L21
发布
2004-03
实施
2004-03-01



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