L47 其他 标准查询与下载

SJ/T 11281-2003 LED显示屏测试方法

本标准对LED显示屏的机械、光学、电学等主要技术性能进行了分级并规定了测试方法。 本标准适用于各类LED显示屏的测试。

LED display test method

SJ/T 11141-2003 LED显示屏通用规范

本标准规定了LED显示屏的定义，分类，技术要求，检验方法，检验规则以及标志、包装、运输、贮存要求。 本标准适用于LED显示屏产品。它是LED显示屏产品设计、制造、测试、安装、验收、使用、质量检验和制订各种技术标准、技术文件的主要技术依据。

General specifications for LED panels

IEC 61747-1:2003 液晶和固态显示器件.第1部分:总规范

Defines general procedures for quality assessment to be used in the IECQ system and gives general rules for measuring methods of electrical and optical characteristics, rules for climatic and mechanical tests, and rules for endurance tests.

Liquid crystal and solid-state display devices - Part 1: Generic specification

SN/T 1175-2003 进出口薄膜晶体管彩色液晶显示器检验方法

Methods for the inspection of thin film transistor color liquid crystal display devices for import and export

SN/T 1176-2003 进出口超扭曲向列相液晶显示器件检验方法

本标准规定了超扭曲向列相液晶显示器件的检验方法。对评价液晶显示器件性能的各项参数的限 定值，本标准不作规定。 本标准适用于进出口超扭曲向列相液晶显示器件的检验。

Methods for the inspection of super-twisted nematic liquid crystal display devices for import and export

ARINC 735A-1 ITEM 6.0-2003 VSI/TCAS显示器

VSI/TCAS Display

VSI/TCAS Display

IEC 61788-11:2003 超导性.第11部分:剩余电阻率的测量.Nb₃Sn复合超导体的剩余电阻率

Covers a test method for the determination of the residual resistance ratio (RRR) of Nb3Sn composite conductors. This method is intended for use with superconductor specimens that have a monolithic structure with a rectangular or round cross section, RRR

Superconductivity - Part 11: Residual resistance ratio measurement; Residual resistance ratio of Nb₃Sn composite superconductors

SJ 52146/2-2002 GS1113K型低功耗数码显示器详细规范

Detail specification for low power dissipation numerical display for type GS1113K

SJ 20847-2002 宽温度范围液晶材料规范

Specification for broad temperature range liquid crystal mixtures

KS C IEC 61747-3:2002 液晶显示装置和固体显示装置.第3部分:液晶显示屏的分规范

이 품종규격은 세그먼트형 흑백 LCD 셀에 적용한다. 이 규격은 LCD 셀 평가에 필요

Liquid crystal and solid state display devices－Part 3：Sectional specification of liquid crystal display (LCD) cells

KS C IEC 61747-2:2002 液晶和固体显示器.第2部分:液晶显示模件.分规范

이 품종규격은 다음과 같은 액정 및 고체상태의 디스플레이 모듈에 적용한다.-정적/

Liquid crystal and solid－state display devices－Part 2：Liquid crystal display modules－Sectional specification

KS C IEC 61747-5:2002 液晶和固态显示装置.第5部分:环境、耐久性和机械试验方法

이 규격은 LCD 소자에 적합한 시험 방법을 기술한다. 이 규격은 가능하다면 IEC 600

Liquid crystal and solid－state display devices－ Part 5 : Environmental, endurance and mechanical test methods

KS C IEC 61747-3-1:2002 液晶和固态显示装置.第3-1部分:液晶显示电池.空白详细规范

1.1 이 규격은 LCD셀의 개별 규격 지침에 대하여 규정한다.1.2 전자 부품에

Liquid crystal and solid-state display devices - Part 3-1 : Liquid crystal display(LCD) cells - Blank detail specification

KS C IEC 61747-4:2002 液晶和固态显示装置.第4部分:液晶显示模件和电池.基本额定值和特性

이 규격은 LCD 셀과 수동 매트릭스 흑백 LCD 모듈의 필수 정격 및 특성을 기술한다.

Liquid crystal and solid-state display devices－Part 4 : Liquid crystal display modules and cells－Essential ratings and characteristics

KS C IEC 61747-2-1:2002 液晶和固体显示器.第2-1部分:无源矩阵单色液晶显示模件.空白详细规范

1.1 이 규격은 수동 매트릭스 단색광 LCD 모듈에 대한 개별규격지침에 대하여 규정한

Liquid crystal and solid-state display devices-Part 2-1:Passive matrix monochrome LCD modules-Blank detail specification

KS C IEC 61788-5:2002 超导性.第5部分:超导体容量比率测量矩阵Cu/Nb-Ti复合超导体的铜对超导容量比率

이 규격은 Cu/Nb-Ti 복합 초전도체의 구리비의 측정 방법에 대하여 규정한다.

Superconductivity-Part 5:Matrix to superconductor volume ratio measurement-Copper to superconductor volume ratio of Cu/Nb-Ti composite superconductors

KS C IEC 61788-3:2002 超导性.第3部分:临界电流测量.Ag护套的Bi-2212和Bi-2223氧化超导体的直流临界电流

이 규격은 짧고 곧은 은(또는 은 합금) 피복 Bi-2212와 Bi-2223 산화물계

Superconductivity-Part 3:Critical current measurement-DC critical current of Ag-sheathed Bi-2212 and Bi-2223 oxide superconductors

KS C IEC 61788-6:2002 超导性.第6部分:机械特性测量.Cu/Nb-Ti复合超导体的铜对超导体容量比率的测量

이 규격은 Cu/Nb-Ti 복합 초전도선의 실온에서 인장 시험 절차에 대하여 규정한다.

Superconductivity - Part 6 : Mechanical properties measurement -Room temperature tensile test of Cu/Nb-Ti composite superconductors

SJ/T 11248-2001 液晶和固态显示器件 第3-1部分：液晶显示（LCD）屏空白详细规范

IEC电子元器件质量评定体系遵循IEC章程并在IEC授权下工作。该体系的目的是确定质量评定程序，以这种方式使一个参加国按有关规范要求放行的电子元器件无需进一步试验而为其它所有参加国同样接受。

Liquid crystal and solid-state display devices Part 3-1:Liquid crystal display(LCD) cells-Blank detail specification

IEC 61788-7:2002 超导性.第7部分:电特性测量.微波频率下超导体的表面电阻

This part of IEC 61788 describes measurement of the surface resistance of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of RS at the resonant frequency. The applicable measurement range of surface resistances for this method is as follows: - Frequency: 8 GHz

Superconductivity - Part 7: Electronic characteristic measurements; Surface resistance of superconductors at microwave frequencies