共找到 323 条与 光电子器件综合 相关的标准,共 22 页
Gives guidance on the protection of photovoltaic stand-alone and grid-connected power generating systems. Identifies sources of overvoltage hazard, including lightning and identifies the various types of protection.
Overvoltage protection for photovoltaic (PV) power generating systems. Guide
Defines predicted short-term characteristics of direct coupled photovoltaic water pumping systems. Also defines minimum actual performance values to be obtained on-site. Does not address PV pumping systems with batteries.
Rating of direct coupled photovoltaic (PV) pumping systems
Describes a resistance to impact test the purpose of which is to assess the susceptibility of a module to accidental impact damage.
Susceptibility of a photovoltaic (PV) module to accidental impact damage (resistance to impact test)
Describes procedures for on-site measurement of crystalline silicon photovoltaic array characteristics and for extrapolating these data to standard test conditions or other selected temperatures and irradiance values.
Crystalline silicon photovoltaic (PV) array - On-site measurement of I-V characteristics
Procedures for temperature and irradiance corrections to measured i-V characteristics of crystalline silicon photovoltaic devices.
This document specifies content and format of reports describing failure analyses of semiconductor devices. For purposes of this document, destructive physical analyses (DPAs), construction analyses, and single analytical service requests are not regarded as failure analysis.
Standard for Failure Analysis Report Format
Divided into three separate sections: Section one (General), Section two (Manufacturing requirements) and Section three (User's guide).
Safety of laser products - Equipment classification, requirements and user's guide
Flickermeter Part 0. Evaluation of flicker severity FOREWORD Clause 1 Statistical evaluation 2 Short-term flicker severity assessment 2.1 Choosing the multipoint algorithm 2.2 Practical checking of the Pst evaluation 2.3 Agreement between simplified assessment methods and evaluation 3 Accuracy of the Pst evaluation 4 Interpolation 4.1 Linear interpolation 4.2 Non-linear interpolation 4.3 Pseudo zero interpolation 5 Smoothing percentile points 6 Non-linear classification 7 Performance tests including the classifier 8 Evaluation of long-term flicker severity 9 Reference FIGURES Annex ZA (normative) Other international publications quoted in this standard with the references of the relevant European publications
Flickermeter. Evaluation of flicker severity
This standard defines the dc input and output specifications for a low-level, high-speed interface for integrated circuits that can be a suDer-set of LVCMOS and LVTTL.
Center-Tap-Terminated (CTT) Low-Level, High- Speed Interface Standard for Digital Integrated Circuits
Relevant terminology and letter symbols, essential ratings and characteristics and measuring methods.
Semiconductor devices. Discrete devices. Recommendations for optoelectronic devices. Section 5: Recommendations for optoelectronic devices
Semiconductor devices. Discrete devices. Recommendations for optoelectronic devices
Control technology; light barriers and light scanners; definitions
The standard specifies definitions which refer to the performance of light barriers and light scanners and coordinate methods of measurement which are to be applied for determination and proof of performance.
Control technology; light barriers and light scanners; method of measurement
Preferred Products List; OPTO Electronic Devices (En, Fr, Ge)
Preferred Products List; OPTO Electronic Devices (En, Fr, Ge)
Control technology; light barriers and light scanners; used symbols
The purpose of this standard is to provide an industry-wide set of specifications, for Application Specific Integrated Circuit (ASIC) signal inputs and outputs, both necessary and sufficientto define a circuit's electrical interfacing with the external environment. Interfacing specifications are necessary at different levels of informational content, and are intended to support the logic interface levels for ECL, TIL, CMOS, and BiCC (see Section 5.).
Interface Standard for Semicustom Integrated Circuits
Prezentul standard stabile?te clasificarea ?i terminologia defectelor ?mbin?rilor sudate din materiale plastice prin procedee de sudare cu element ?nc?lzitor si cu gaz ?nc?lzit. Terminologia din prezentul standard nu este limitativ?.
Plastic welded joints. Defects. Classification and terminology
It shall be unlawful to interfere with, attempt to interfere with, conspire to interfere with, obstruct or restrict the mobility of or block the path of travel of any fire department emergency vehicle in any way, or to interfere with, attempt to inter
Welding or Cutting, Calcium Carbide and Acetylene Generators
Copyright ©2007-2022 ANTPEDIA, All Rights Reserved
京ICP备07018254号 京公网安备1101085018 电信与信息服务业务经营许可证:京ICP证110310号