L55 微电路综合 标准查询与下载

DLA SMD-5962-95504 REV D-2007 杆对杆双重或四重运算放大器硅单片电路线型微电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, LINEAR, RAIL-TO-RAIL, DUAL/QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-98564 REV A-2007 微型电路,数字型,双极,BCD到7区解码器/驱动器,单块硅

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) space application (device class V).

MICROCIRCUIT, DIGITAL, BIPOLAR, BCD-TO-SEVEN-SEGMENT DECODER/DRIVER MONOLITHIC SILICON

DLA SMD-5962-97636 REV A-2007 微型电路,数字型,双极,带闪频仪的双路4输入端非门,单块硅

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, DIGITAL, BIPOLAR, DUAL 4-INPUT NOR GATES WITH STROBE, MONOLITHIC silicon

DLA SMD-5962-96687 REV B-2007 精密温度感应器硅单片电路微电路

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.

MICROCIRCUIT, LINEAR, PRECISION TEMPERATURE SENSOR, MONOLITHIC SILICON

DLA SMD-5962-96796 REV D-2007 128K X 8-BIT带电的可消除编程只读器硅单片电路数字记忆微电路

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.

MICROCIRCUIT, MEMORY, 128K X 8-BIT, ELECTRICALLY ERASABLE PROGRAMMABLE READ ONLY MEMORY, MONOLITHIC SILICON

DLA SMD-5962-97557 REV B-2007 单通道光耦合器混合线型微电路

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.

MICROCIRCUIT, HYBRID, LINEAR, SINGLE CHANNEL, OPTICAL COUPLER

DLA SMD-5962-90962 REV B-2007 硅单块 解算器到数字变换器,直线式微型电路

The General Services Administration has authorized the use of this commercial item description as a replacement for Military Specifications MIL-V-16720E and MIL-V-16721D which are cancelled.

MICROCIRCUIT, LINEAR, RESOLVER-TO-DIGITAL CONVERTER, MONOLITHIC SILICON

DLA QML-38535-20-2007 集成电路(微电路)制造.一般要求

Package lead counts are listed by the maximum number of leads covered by the qualification.

INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING GENERAL REQUIREMENTS FOR

DLA SMD-5962-88509 REV E-2007 数位类比转换器12位四方混合动力线性微电路

This drawing describes device requirements for class H hybrid microcircuits to be processed in accordance with MIL-PRF-38534 and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN).

MICROCIRCUIT, HYBRID, LINEAR, QUAD, 12-BIT, DIGITAL-TO-ANALOG CONVERTER

DLA SMD-5962-90905 REV B-2007 硅单块 操作放大器,电流反作用,高速直线式微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, LINEAR, HIGH SPEED, CURRENT FEEDBACK, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-94692 REV C-2007 杆对杆双重或四运算(操作)放大器硅单片电路线型微电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, LINEAR, RAIL-TO-RAIL, DUAL/QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-99608 REV A-2007 微型电路,混合型,线型,5伏单通道,DC/DC转换器

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.

MICROCIRCUIT, HYBRID, LINEAR, 5 VOLT, SINGLE CHANNEL, DC/DC CONVERTER

DLA SMD-5962-99610 REV B-2007 微型电路,混合型,数字线型,12位双通道,模数转换器

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.

MICROCIRCUIT, HYBRID, DIGITAL-LINEAR, 12-BIT, DUAL CHANNEL, ANALOG TO DIGITAL CONVERTER

DLA SMD-5962-98649 REV B-2007 微型电路,线型,可调节的正压低压差线性稳压器,单块硅

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.

MICROCIRCUIT, LINEAR, VOLTAGE REGULATOR, POSITIVE, ADJUSTABLE, LOW DROPOUT, MONOLITHIC SILICON

DLA SMD-5962-99563 REV B-2007 微型电路,混合型,线型,5伏双通道,DC/DC转换器

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.

MICROCIRCUIT, HYBRID, LINEAR, ?5 VOLT, DUAL CHANNEL, DC/DC CONVERTER

DLA SMD-5962-99556 REV B-2007 微型电路,混合型,线型,12伏左右,双通道,DC-DC转换器

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.

MICROCIRCUIT, HYBRID, LINEAR, PLUS/MINUS 12-VOLT, DUAL CHANNEL, DC-DC CONVERTER

DLA SMD-5962-97587 REV A-2007 微型电路,数字型,双极,具有快速进位的 4 位二进制全加器,单块硅

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, DIGITAL, BIPOLAR, 4-BIT BINARY FULL ADDER WITH FAST CARRY, MONOLITHIC SILICON

DLA QML-38534-58-2007 混合微电路.一般规格

This report has been prepared to show the products qualified to MIL-PRF-38534 as of the date of this report. Listing of a product is not intended to and does not connote endorsement of the product by the Department of Defense. All products listed herein have been qualified under the requirements for the product as specified in the latest effective issue of the applicable specification.

HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR

ANSI/EIA 656-B:2007 I/O减震器信息规范(IBIS)

IBIS is a standard for specifying the electronic behavior of digital integrated circuit input/output (I/O) analog characteristics. IBIS defines a consistent software-parsable format for essential behavioral information. Within the IBIS format, vendors can accurately model buffers while minimizing disclosure of proprietary design information. IBIS is intended to support simulation tools at many levels of sophistication.

I/O Buffer Information Specification (IBIS)

NF C96-050-2*NF EN 62047-2:2006 半导体装置.微型机电装置.第2部分:薄膜材料的拉伸试验方法

Semiconductor devices - Micro-electromechanical devices - Part 2 : tensile testing methods of thin film materials.