L55 微电路综合 标准查询与下载

DLA SMD-5962-86023 REV C-2005 硅单块 双极256比特随机存取存储器,数字主储存器微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, MEMORY, DIGITAL, BIPOLAR 256-BIT RAM, MONOLITHIC SILICON

DLA SMD-5962-95604 REV D-2005 双重高速低功率反馈放大器硅单片电路线型微电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN

MICROCIRCUIT, LINEAR, DUAL, HIGH SPEED, LOW POWER, FEEDBACK AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-87520 REV D-2005 硅单块 程序间隔计时器微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, PROGRAMMABLE INTERVAL TIMER, MONOLITHIC SILICON

DLA SMD-5962-93258 REV F-2005 硅单片,耐辐射准确高速四重运算扬声器,线性微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, LINEAR, RADIATION HARDENED, PRECISION, HIGH SPEED, QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-86051 REV C-2005 硅单块 双极64比特随机存取存储器,数字主储存器微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, MEMORY, DIGITAL, BIPOLAR 64-BIT RAM, MONOLITHIC SILICON

DLA SMD-5962-89842 REV B-2005 硅单片,可编程电压检测器,线性微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, PROGRAMMABLE VOLTAGE DETECTORS, MONOLITHIC SILICON

DLA SMD-5962-86055 REV A-2005 硅单块 电致发光的纵驱动器,直线型微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, ELECTROLUMINESCENT COLUMN DRIVER, MONOLITHIC SILICON

DLA SMD-5962-87572 REV D-2005 硅单块 差异电压比较器,直线型微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, DIFFERENTIAL VOLTAGE COMPARATORS, MONOLITHIC SILICON

DLA SMD-5962-94676 REV F-2005 极速的硅单片电路电流反馈(回授)放大线型微电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

MICROCIRCUIT, LINEAR, CURRENT FEEDBACK AMPLIFIER, ULTRA HIGH SPEED, MONOLITHIC SILICON

DLA SMD-5962-91758 REV G-2005 硅单块 电压填充操作放大器,高速直线式微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

MICROCIRCUIT, LINEAR, HIGH SPEED, VOLTAGE, FEEDBACK OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-87741 REV H-2005 硅单片阴性可调式调节器线性微电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, NEGATIVE ADJUSTABLE REGULATOR, MONOLITHIC SILICON

DLA SMD-5962-87605 REV B-2005 硅单块 阴极电压控制器,直线型微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, NEGATIVE VOLTAGE REGULATOR, MONOLITHIC SILICON

DLA SMD-5962-82009 REV K-2005 硅单片64千比特程序可控只读存储器,双极数字记忆微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, MEMORY, DIGITAL, BIPOLAR 64K (8K X 8) PROGRAMMABLE READ ONLY MEMORY (PROM), MONOLITHIC SILICON

DLA SMD-5962-95539 REV A-2005 军标1553/1760协议,5伏特供应双多余远程终端混合线型微电路

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.

MICROCIRCUIT, HYBRID, LINEAR, MIL-STD-1553/1760 PROTOCOL, DUAL REDUNDANT, REMOTE TERMINAL UNIT, +5 VOLT SUPPLY

DLA SMD-5962-94593 REV D-2005 硅单片,800兆赫电流反馈扬声器,线性微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, LINEAR, 800 MHZ, CURRENT FEEDBACK AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-86054 REV A-2005 硅单块 电致发光的列驱动器,直线型微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, ELECTROLUMINESCENT ROW DRIVER, MONOLITHIC SILICON

GJB 5440-2005 过载传感器通用规范

本标准规定了串行的模块测试与维护总线（以下简称“MTM总线”）协议。MTM总线由一块或数块逻辑电路板组成，该总线可用于将不同设计者或者制造商提供的模块集成为一个可测试、可维护的子系统。（本标准中“电路板”是广义的，指在系统集成层次里，位于器件级以上的、集成的和可更换的单元，例如：印刷电路板组件，多芯片模块组件等）。 本标准规定的MTM总线协议，确定了在MTM总线上子系统测试控制模块（MTM总线主模块）与其余模块（MTM总线从模块）之间的通信方法。通过MTM总线，可传输测试与维护命令及串行数据。MTM总线可以作为整个测试与维护接口体系结构的一部分，该体系结构中还可以包括其他的测试总线。

Modele test and maintenance bus(MTM-bus) protocol

DLA SMD-5962-99609 REV A-2005 微型电路,混合型,线型,12伏双通道,DC/DC转换器

This drawing documents five product assurance classes, class D (lowest reliability), class E, (exceptions), class G(lowest high reliability), class H (high reliability), and class K, (highest reliability) and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.

MICROCIRCUIT, HYBRID, LINEAR, 12 VOLT, DUAL CHANNEL, DC/DC CONVERTER

DLA SMD-5962-84180 REV E-2005 硅单片精确电压基准分路调节器,线性微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, PRECISION VOLTAGE REFERENCES, SHUNT REGULATORS, MONOLITHIC SILICON

DLA SMD-5962-95501 REV B-2005 5伏特双通道直流电和直流电转换器混合线型微电路

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.

MICROCIRCUIT, HYBRID, LINEAR, 5 VOLT, DUAL CHANNEL, DC/DC CONVERTER