L56 半导体集成电路 标准查询与下载

DLA SMD-5962-88684 REV A-2007 硅单片64分计数器预定标器发光数字微电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, DIGITAL, ECL, COUNTER DIVIDE BY 64 PRESCALER, MONOLITHIC SILICON

DLA SMD-5962-00501 REV C-2007 单片硅线性微电路辐射硬化精密电压基准

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V).

MICROCIRCUIT, LINEAR, RADIATION HARDENED, PRECISION VOLTAGE REFERENCE, MONOLITHIC SILICON

DLA SMD-5962-85016 REV D-2007 硅单片14级二进计数器,高速氧化物半导体数字微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, DIGITAL, CMOS, PROGRAMMABLE INTERRUPT CONTROLLER, MONOLITHIC SILICON

DLA SMD-5962-89935 REV B-2007 硅单片,装有独立I/O分址的64K X 4静态随机存取存储器,高速氧化物半导体数字记忆微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUITS, MEMORY, DIGITAL, CMOS, 64K X 4 SRAM WITH SEPARATE I/O, MONOLITHIC SILICON

DLA SMD-5962-88604 REV B-2007 硅单片双向收发器双极化数字微电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, DIGITAL, BIPOLAR, BIDIRECTIONAL TRANSCEIVERS, MONOLITHIC SILICON

DLA SMD-5962-92196 REV A-2007 硅单片,TTL兼容输入,装有三态输出的8位双向收发器/锁存器,改进型氧化物半导体数字微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL TRANSCEIVER/REGISTER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

DLA SMD-5962-94615 REV A-2007 硅单片,装有三态输出,TTL可兼容输入的寄存的总线收发器的扫描测试设置,改进型氧化物半导体双极数字微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL REGISTERED BUS TRANSCEIVER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

DLA SMD-5962-05206 REV A-2007 硅单片1 GSPS模拟数字变换器,双8比特,低功率氧化物半导体数字微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

MICROCIRCUIT, DIGITAL-LINEAR, CMOS, LOW POWER, DUAL 8-BIT, 1 GSPS ANALOG-TO-DIGITAL CONVERTER, MONOLITHIC SILICON

DLA SMD-5962-87570 REV E-2007 硅单块 可编程序外围接口数字微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, DIGITAL, PROGRAMMABLE PERIPHERAL INTERFACE, MONOLITHIC SILICON

DLA SMD-5962-00538 REV E-2007 单片硅数字线性微电路低功耗微处理器复位电路

This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar applications (device class T).

MICROCIRCUIT, DIGITAL-LINEAR, POWER-ON MICROPROCESSOR RESET CIRCUIT, MONOLITHIC SILICON

DLA SMD-5962-87552 REV J-2007 硅单块 带三态输出的八进制缓冲器或行驱动线,高级互补金属氧化物半导体数字微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUITS, DIGITAL, ADVANCED CMOS, OCTAL BUFFER/LINE DRIVER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON

DLA SMD-5962-87751 REV A-2007 硅单片计数机控制逻辑发光数字微电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, DIGITAL, ECL, COUNTER CONTROL LOGIC, MONOLITHIC SILICON

DLA SMD-5962-87773 REV B-2007 硅单片单杆多频振荡器发光数字微电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, DIGITAL, ECL, ONE SHOT MULTIVIBRATOR, MONOLITHIC SILICON

DLA SMD-5962-87590 REV C-2007 硅单块 二进制计数器,发射极耦合逻辑,数字微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A

MICROCIRCUIT, DIGITAL, ECL, BINARY COUNTER, MONOLITHIC SILICON

JJF 1179-2007 集成电路高温动态老化系统校准规范

本规范适用于集成电路高温动态老化系统的校准。

Calibration Specification of High Temperature Dynamic IC Burn-in System

DLA SMD-5962-89577 REV J-2007 硅单片,总线控制器,远程终端及显示器,氧化物半导体数字记忆微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

MICROCIRCUIT, DIGITAL, CMOS, BUS CONTROLLER, REMOTE TERMINAL AND MONITOR, MONOLITHIC SILICON

DLA SMD-5962-87569 REV D-2007 硅单块 双4-5输入或非门,发射极耦合逻辑,数字微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, DIGITAL, ECL, DUAL 4-5 INPUT OR/NOR GATE, MONOLITHIC SILICON

DLA SMD-5962-87565 REV D-2007 硅单块 四列二输入或门,发射极耦合逻辑,数字微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, DIGITAL, ECL, QUAD 2-INPUT OR GATE, MONOLITHIC SILICON

DLA SMD-5962-89575 REV C-2007 硅单片,装有1K X 16随机存取存储器的运程终端,氧化物半导体数字记忆微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, DIGITAL, CMOS, REMOTE TERMINAL FOR STORES WITH 1K X 16 RAM, MONOLITHIC SILICON

DLA SMD-5962-90803 REV C-2007 硅单块 互补金属氧化物半导体8K X8比特程序,数字主储存器微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, MEMORY, DIGITAL, CMOS 8K X 8-BIT PROM, MONOLITHIC SILICON