N32 放大镜与显微镜 标准查询与下载

ASTM E986-04 扫描电子显微镜射束尺寸特征描述标准实施规程

The traditional resolution test of the SEM requires, as a first step, a photomicrograph of a fine particulate sample taken at a high magnification. The operator is required to measure a distance on the photomicrograph between two adjacent, but separate edges. These edges are usually less than one millimetre apart. Their image quality is often less than optimum limited by the S/N ratio of a beam with such a small diameter and low current. Operator judgment is dependent on the individual acuity of the person making the measurement and can vary significantly. Use of this practice results in SEM electron beam size characterization which is significantly more reproducible than the traditional resolution test using a fine particulate sample.1.1 This practice provides a reproducible means by which one aspect of the performance of a scanning electron microscope (SEM) may be characterized. The resolution of an SEM depends on many factors, some of which are electron beam voltage and current, lens aberrations, contrast in the specimen, and operator-instrument-material interaction. However, the resolution for any set of conditions is limited by the size of the electron beam. This size can be quantified through the measurement of an effective apparent edge sharpness for a number of materials, two of which are suggested. This practice requires an SEM with the capability to perform line-scan traces, for example, Y-deflection waveform generation, for the suggested materials. The range of SEM magnification at which this practice is of utility is from 1000 to 50 000 x. Higher magnifications may be attempted, but difficulty in making precise measurements can be expected.1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Scanning Electron Microscope Beam Size Characterization

DIN ISO 10937:2003 光学和光学仪器.显微镜.可互换目镜的直径

Specification of the diameter of interchangeable eyepieces for microscopes.

Optics and optical instruments - Microscopes - Diameter of interchangeable eyepieces (ISO 10937:2000)

ISO 14880-1:2001/Cor 1:2003 显微物镜系列.第1部分:词汇.技术勘误1

This is Technical Corrigendum 1 to ISO 14880-1-2001 (Microlens array — Parti: Vocabulary)

Microlens array - Part 1: Vocabulary; Technical Corrigendum 1

BS ISO 9345-2:2003 光学和光学仪器.显微镜.相对机械参考面的象距.无限大光学校正系统

This part of ISO 9345 specifies the imaging distances of objectives, eyepieces and the focal length of "normal" tube lenses of microscopes with infinity-corrected optical systems. NOTE A specific combination of eyepiece, objective and tube lens is frequently used to correct aberrations. Therefore the combination of an objective from one manufacturer and the tube lens or eyepiece from another manufacturer, although conforming to this part of ISO 9345, may cause errors in magnification and/or in optical performance.

Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Infinity-corrected optical systems

DIN ISO 8037-1:2003 光学和光学仪器.显微镜.载玻片.第1部分:尺寸、光学性能和标志

Specification of requirements for dimensions, thickness, optical properties and tolerances for microscope slides used for transmitted light microscopy in the visible spectral range.

Optics and optical instruments - Microscopes; Slides - Part 1: Dimensions, optical properties and marking (ISO 8037-1:1986)

DIN ISO 8040:2003 光学和光学仪器.显微镜.镜筒导板和镜筒槽的连接尺寸

Specification of mechanical dimensions required for the interchange of auxiliary optics and compensators on microscopes made by all manufacturers.

Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections (ISO 8040:2001)

JIS B 7141:2003 显微镜.物镜螺纹

この規格は，顕微鏡対物レンズ，レボルバなどのねじ部及びねじ(以下，対物ねじという。)について適用する。ただし，特殊対物レンズには適用しない。

Microscope -- Screw thread for objectives

ISO 9345-2:2003 光学和光学仪器.显微镜.相对机械参考面的象距.第2部分:无限大光学校正系统

This part of ISO 9345 specifies the imaging distances of objectives, eyepieces and the focal length of "normal" tube lenses of microscopes with infinity-corrected optical systems. NOTE A specific combination of eyepiece, objective and tube lens is frequently used to correct aberrations. Therefore the combination of an objective from one manufacturer and the tube lens or eyepiece from another manufacturer, although conforming to this part of ISO 9345, may cause errors in magnification and/or in optical performance.

Optics and optical instruments - Microscopes: Imaging distances related to mechanical reference planes - Part 2: Infinity-corrected optical systems

BS ISO 10934-1:2003 光学和光学仪器.显微镜词汇.光学显微镜

This part of ISO 10934 specifies terms and definitions to be used in the field of light microscopy.

Optics and optical instruments - Vocabulary for microscopy - Light microscopy

ISO 10934-1:2002 光学和光学仪器.显微镜词汇.第1部分:光学显微镜

This part of ISO 10934 specifies terms and definitions to be used in the field of light microscopy.

Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy

ISO 8037-2:1997/cor 1:2002 光学和光学仪器.显微镜.载玻片.第2部分:材料质量、成品标准和包装模式.技术勘误1

This is Technical Corrigendum 1 to ISO 8037-2-1997 (Optics and optical instruments — Microscopes — Slides Part 2: Quality of material, standard of finish and mode of packaging)

Optics and optical instruments - Microscopes; Slides - Part 2: Quality of material, standards of finish and mode of packaging; Technical Corrigendum 1

DIN ISO 8576:2002 光学和光学仪器.显微镜.偏振光显微镜基准系统 (ISO 8576:1996)

Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)

ASTM E1951-02(2007) 校准标度线和轻型显微镜放大的标准指南

These methods can be used to determine magnifications as viewed through the eyepieces of light microscopes. These methods can be used to calibrate microscope magnifications for photography, video systems, and projection stations. Reticles may be calibrated as independent articles and as components of a microscope system.1.1 This guide covers methods for calculating and calibrating microscope magnifications, photographic magnifications, video monitor magnifications, grain size comparison reticles, and other measuring reticles. Reflected light microscopes are used to characterize material microstructures. Many materials engineering decisions may be based on qualitative and quantitative analyses of a microstructure. It is essential that microscope magnifications and reticle dimensions be accurate.1.2 The calibration using these methods is only as precise as the measuring devices used. It is recommended that the stage micrometer or scale used in the calibration should be traceable to the National Institute of Standards and Technology (NIST) or a similar organization.1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Guide for Calibrating Reticles and Light Microscope Magnifications

DIN ISO 8577:2001 光学和光学仪器.显微镜.滤光镜

The document specifies recommended diameters to allow the interchangeability of spectral filters used in microscopes, as well as permissible filter material defects and processing faults.#,,#

Optics and optical instruments - Microscopes - Spectral filters (ISO 8577:1997)

BS 7012-16:2001 光显微镜.可更换目镜的直径

This International Standard specifies the diameter of interchangeable eyepieces for microscopes. NOTE A specific combination of eyepiece, objective and tube lens is frequently used to correct aberrations. Therefore the combination of an objective from one manufacturer and the tube lens or eyepiece from another manufacturer, although conforming to this International Standard, may cause errors in magnification and/or in optical performance.

Light microscopes - Diameter of interchangeable eyepieces

BS ISO 8040:2001 光学和光学仪器.显微镜.镜筒导板和镜筒槽连接件尺寸

This International Standard specifies the mechanical dimensions required for the interchange of auxiliary optics and compensators on microscopes made by all manufacturers.

Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections

JIS B 7252:2001 显微镜物镜和目镜的标记

この規格は，顕微鏡に用いる対物レンズ及び接眼レンズの光学的な特徴，性能などを表示する方法を規定する。

Marking of microscope objectives and eyepieces

ISO 8038-2:2001 光学和光学仪器 显微物镜及显镜座螺纹 第2部分:螺纹类型 M25×0.75mm

GB/T 22055的本部分规定了不同于RMS 标准的联接显微镜与物镜转换器的M25型螺纹的尺寸。 注：一个目镜、物镜和镜筒透镜的特定的系统（例如：无限远校正光学系统）通常是校正好像差的， 因此由一个厂商制造的物镜和另一个厂商制造的目镜组合， 即使都符合本部分的规定， 仍可能引起放大率的误差和/或像质的降低。

Optics and optical instruments - Screw threads for microscope objectives and related nosepieces - Part 2: Screw thread type M25 x 0,75 mm

ISO 10936-2:2001 光学和光学仪器 手术显微镜 第2部分:眼外科手术用手术显微镜的轻度危险

This part of ISO 10936 specifies requirements and test methods for optical radiation hazards from operation microscopes which are used during ocular surgery. NOTE General requirements for operation microscopes and test methods for these requirements are specified in ISO 10936-1.

Optics and optical instruments - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery

ISO 8040:2001 光学和光学仪器 显微镜 镜筒导板和镜筒槽的连接尺寸

This International Standard specifies the mechanical dimensions required for the interchange of auxiliary optics and compensators on microscopes made by all manufacturers.

Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections