TESCAN S9000G 超高分...
参数指标我要纠错




分辨率标准模式
In-Beam SE
0.7 nm at 15 keV
1.4 nm at 1 keV
In-Beam f-BSE (option)
1.6 nm at 15 keV
Low Vacuum Mode:
BSE
(UH RESOLUTION)
2.0 nm at 30 keV
LVSTD (ANALYSIS)
3.0 nm at 30 keV
Beam Deceleration mode (option):
SE (BDM)
1.0 nm at 1 keV
1.2 nm at 200 eV
STEM mode (option):
0.6 nm at 30 keV
zei大视场

4.3 mm at WD

分析5 mm

7.0 mm at WD 30 mm

电子束能量200 eV to 30 keV / down to 50 eV with the BDT option
探针电流2 pA to 400 nA


(离子光学系统)视野范围:1 mm

(离子光学系统)探针电流:<1 pA ~ 100 nA

(离子光学系统)分辨率:<2.5 nm @ 30 keV

(离子光学系统)发射源:镓液态金属离子源

(电子光学系统)视野范围:7.0 mm @ WD=30 mm

(电子光学系统)探针电流:~ 400 nA

(电子光学系统)分辨率:0.7 nm @ 15 kV

(电子光学系统)发射源:肖特基场发射源








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