高分辨率飞行时间气溶胶质谱仪 ( HToF-AMS )技术特点

【技术特点】-- 高分辨率飞行时间气溶胶质谱仪 ( HToF-AMS )

仪器概述

高分辨率飞行时间气溶胶质谱仪（英文名：High-Resolution Time-of-Flight Aerosol Mass Spectrometer；英文缩写：HR-ToF-AMS）是新版的设计，质谱仪升级为正钜阵飞行时间质谱仪。HR-ToF-AMS通过热力气化和 70eV 的离化电极电子碰撞电离，该仪器能快速、实时、定量地分析和测量粒径介于0.04-1.0微米的非高熔点（200-900oC）气溶胶的化学组成和飞行动力学等效直径。

图1. AMS所测量化学成分质量浓度的粒径分布，A.Middlebrook等，2012。

ANMF = Ammonium Nitrate Mass Fraction

而且，该仪器也可用于基于高分辨率质谱的元素分析（碳氧比例）研究。

图2. AMS测量各组分离子的质谱图。P. DeCarlo等. 2006

由于该仪器采用热气化分解，所以其仅能分析气溶胶中非难熔物质，如硝酸盐、硫酸盐、铵盐、有机物及非海盐类氯化物；而不能测量难熔性气溶胶物质，如黑碳、海盐及扬尘类气溶胶。若需要测量难熔性气溶胶物质请查看黑碳气溶胶质谱仪。

质谱结构

图1. 高分辨飞行质谱仪结构

应用范围

• 测量环境大气中气溶胶的质量和粒径分布

• 描述燃烧源中排放物的特性；在测量排放物中CO2的同时直接确定OC的含量。

• 测量气溶胶硫酸盐、硝酸盐、铵盐等的涡度相关通量和没有降水过程时有机物的沉降通量。

• 在经济的移动平台上 (如搬运车、小型飞机)测量微小气溶胶的高时间分辨率的变化特性。

• 实验室里诊断气溶胶的物理和化学特性。

【技术特点对用户带来的好处】-- 高分辨率飞行时间气溶胶质谱仪 ( HToF-AMS )

【典型应用举例】-- 高分辨率飞行时间气溶胶质谱仪 ( HToF-AMS )

【产品所获奖项】-- 高分辨率飞行时间气溶胶质谱仪 ( HToF-AMS )

参考文献

1. Jayne, J.T., D.C. Leard, X. Zhang, P. Davidovits, K.A. Smith, C.E. Kolb, and D.R.Worsnop, Development of an Aerosol Mass Spectrometer for Size and Composition. Analysis of Submicron Particles, Aerosol Science and Technology, 33, 49-70, 2000.

2. Jimenez, J.L., J.T. Jayne, Q. Shi, C.E. Kolb, D.R. Worsnop, I. Yourshaw, J.H. Seinfeld, R.C. Flagan, X. Zhang, K.A. Smith, J. Morris, and P. Davidovits, Ambient Aerosol Sampling with an Aerosol Mass Spectrometer. Journal of Geophysical Research - Atmospheres, 108(D7), 8425, doi:10.1029/2001JD001213, 2003.

3. DeCarlo, P.F., J.R. Kimmel, A. Trimborn, M.J. Northway, J.T. Jayne, A.C. Aiken, M. Gonin, K. Fuhrer, T. Horvath, K. Docherty, D.R. Worsnop, and J.L. Jimenez, Field-Deployable, High-Resolution, Time-of-Flight Aerosol Mass Spectrometer, Analytical Chemistry, 78: 8281-8289, 2006.

4. Canagaratna, M.R., J.T. Jayne, J.L. Jimenez, J.D. Allan, M.R. Alfarra, Q. Zhang, T.B. Onasch, F. Drewnick, H. Coe, A. Middlebrook, A. Delia, L.R. Williams, A.M. Trimborn, M.J. Northway, P.F. DeCarlo, C.E. Kolb, P. Davidovits, D.R. Worsnop, Chemical and Microphysical Characterization of Ambient Aerosols with the Aerodyne Aerosol Mass Spectrometer, Mass Spectrometry Reviews, 26, 185– 222, 2007.

5. Drewnick, F., S.S. Hings, P.F. DeCarlo, J.T. Jayne, M. Gonin, K. Fuhrer, S. Weimer, J.L. Jimenez, K.L. Demerjian, S. Borrmann, D.R. Worsnop. A new Time-of-Flight Aerosol Mass Spectrometer (ToF-AMS) – Instrument Description and First Field Deployment, Aerosol Science and Technology, 39:637–658, 2005

Development of an aerosol mass spectrometer for size and composition analysis of submicron particles, J.T. Jayne,  D.C. Leard, X. Zhang, P. Davidovits, K.A. Smith, C.E. Kolb, and D.R. Worsnop,  Aerosol Sci. Technol., 33, 49-70, 2000.

Ambient Aerosol Sampling with an Aerosol Mass Spectrometer, J. L. Jimenez, J. T. Jayne, Q. Shi, C.E. Kolb, D.R. Worsnop, I. Yourshaw, J.H. Seinfeld, R.C. Flagan, X. Zhang, K.A. Smith, J. Morris, and P. Davidovits,  J. Geophys. Res. - Atmospheres, 108, (D7), 8425, doi:10.1029/2001JD001213, 2003.

A new Time-of-Flight Aerosol Mass Spectrometer (ToF-AMS) – Instrument Description and First Field Deployment, F. Drewnick, S.S. Hings, P.F. DeCarlo, J.T. Jayne, M. Gonin, K. Fuhrer, S. Weimer, J.L. Jimenez, K.L. Demerjian, S. Borrmann, D.R. Worsnop. Aer. Sci. Technol., 39, 637–658, 2005.

A Field-Deployable High-Resolution Time-of-Flight Aerosol Mass Spectrometer, P. F. DeCarlo,  J.R. Kimmel, A. Trimborn, M.J. Northway, J.T. Jayne, A.C. Aiken, M. Gonin, K. Fuhrer, T. Horvath, K. Docherty, D.R. Worsnop, and J.L. Jiménez, , Anal. Chem., 78, 8281-8289, 2006.

Chemical and Microphysical Characterization of Ambient Aerosols with the Aerodyne Aerosol Mass Spectrometer, M.R. Canagaratna,  J.T. Jayne, J.L. Jiménez, J.D. Allan, M.R. Alfarra, Q. Zhang, T.B. Onasch, F. Drewnick, H. Coe, A. Middlebrook, A. Delia, L.R. Williams, A.M. Trimborn, M.J. Northway, P.F. DeCarlo, C.E. Kolb, P. Davidovits, and D.R. Worsnop,  Mass Spectrom. Rev., 26, 185-222, 2007.

♦ A complete list of publications related to the AMS and electronic files are available at:  http://cires.colorado.edu/jimenez/ams-papers.html.