Perform advanced XRD analyses and combined studies in real time with a 4-circle X-Ray diffractometer. The Thermo Scientific™ ARL™ EQUINOX 6000 X-ray Diffractometer is designed for materials science applications including thin layer analysis, reflectometry, micro-diffraction, residual stress analysis, and texture measurements. Data is measured in real time which is a significant advantage in kinetics experiments or combined analyses. Measurements are very fast compared with other diffractometers because the unique Equinox curved detector can measure all diffraction peaks simultaneously.
描述
ARL EQUINOX 5000 系统在 θ/θ 或 θ/2θ 模式中利用独特的高垂直测角仪,带高精度Eulerian摇篮
utilizes an unique tall vertical goniometer in θ/θ or θ/2θ mode with an attached high precision Eulerian cradle.
软件应用:纹理,应力,薄膜,定性分析,相鉴定和定量,洁净度测定,晶体结构分析,Rietveld分析,相变
Texture, stress, thin film, qualitative analysis, phase identification and quantification, degree of crystallinity determination, crystal structure analysis, Rietveld analysis, and phase transition.
应用: Research, Geology, Mining, Metallurgy, Polymers, Biomaterials, Electronics, Photovoltaic.
Thermo Scientific™ ARL™ EQUINOX 6000 四圆织构/应力XRD