技术优势：

• Controlled thinning rate

• Precise

• Easy to use

• Automated operation

• Alignment microscope

Prethins specimens for ion milling

The Model 200 Dimpling Grinder is a state-of-the-art mechanical grinder for preparing electron microscopy samples. It is indispensable when ion milling is used for final specimen thinning. Once the specimen is prethinned by dimpling, ion milling must remove only a relatively small amount of material.

High-quality specimens for transmission electron microscopy need to be both rugged and have a large electron transparent area for analysis. Dimpling is a rapid technique that involves rotating both the grinding wheel and the specimen. This combination of motions produces a specimen with only its central area reduced to a thickness of a few microns.

Automated, precise, easy to use

The automated and versatile dimpling grinder can be used for flat grinding, dimpling, or polishing. The dimpling grinder features grinding rate control, a precise indication of specimen thickness, and an easy-to-use interface.

The specimen can be accurately positioned using an optical microscope with transmitted and/or reflected light. The final specimen thickness is readily programmed for accurate, unattended operation. 

技术优势：

受控减薄率

准确的

易于使用

自动化操作

对准显微镜

用于离子铣削的Prethins试样

200型压痕研磨机是一种用于制备电子显微镜样品的最先进的机械研磨机。当使用离子铣削进行最终试样减薄时，这是必不可少的。一旦样品通过凹陷预处理，离子铣削必须只去除相对少量的材料。

用于透射电子显微镜的高质量样品需要既坚固又有大的电子透明区域用于分析。压痕是一种快速技术，包括旋转砂轮和试样。这种运动的组合产生了一个样品，其中心区域仅减小到几微米的厚度。

自动化、精确、易于使用

自动多功能压痕研磨机可用于平面研磨、压痕或抛光。凹陷研磨机具有研磨速率控制、样品厚度的精确指示和易于使用的界面。

可以使用具有透射光和/或反射光的光学显微镜来精确定位样品。最终试样厚度易于编程，可实现精确、无人值守的操作。