技术参数: Temp. Ramp Rate: up to 1500 ℃/min Max. Temp. of Probe: 500℃(dependent on probe) Imaging Modes: Contact mode/Oscillationg mode(dependent on SPM) Probe Spring Constant: ranges from 0.1N/m to 5N/m Probe Resonant Frequency: ranges form 20 to 50kHz Tip Radius: 10-20nm Tip Height: 1-5micros
主要特点: *System incldues Software, Power Supply , TMA controller, CAL box, Bridge box, Calibration samples and five nano-TA silicon probes *Probes come premounted for easy exchange and allow high resolution imageing and heating up 500℃ *Rapid controllable Thermo-Mechanical Analysis with heating rages of up to 1500 ℃/min. *Indentify/Characterize individual phases from their onset and peak temperatures and by mesuring their thermal properties *Currently compatible with a number of commercially availabe SPMs contact Anasys Insturments to see if your system will operate with nano-TA