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 SOI键合EVG®810 LT+EVG®301
700000 参考价
SOI键合EVG®810 LT+EVG®301
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型号型号:EVG®810 LT+EVG®

品牌品牌:EVG

产地产地:奥地利

上海螣芯电子科技有限公司

核心参数
产地: 欧洲
供应商性质: 生产商
产地类别: 进口
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产品描述

产品描述

EVG®810 LT

Features

  • Surface plasma activation for low-temperature bonding (fusion/molecular and intermediate layer bonding)

  • Fastest kinetics of any wafer bonding mechanism

  • No wet processes required

  • Highest bond strength at low temperature annealing (up to 400 °C)

  • Applicable for SOI, MEMS, compound semiconductors, and advanced substrates bonding

  • High degree of materials compatibility (including CMOS)

Technical Data

Wafer diameter (substrate size)
50 - 200, 100 - 300 mm
LowTemp™ plasma activation chamber
Process gases: 2 standard process gases (N2 and O2)
Universal mass flow controller: self-calibrating (up to 20.000 sccm)
Vacuum system: 9x10-2 mbar
Opening / closing of chamber: automated
Loading / unloading of chamber: manual (wafer / substrate placed on loading pins)
Optional features
Chuck for different wafer sizes
Metal ion-free activation
Additional process gases with gas mixing
High vacuum system with turbo pump: 9x10-3 mbar base pressure
Material systems that are qualified with LowTemp™ plasma activated bonding
Si: Si/Si, Si/Si (thermally oxidized, Si (thermally oxidized)/Si (thermally oxidized)
TEOS/TEOS (thermally oxidized)
Si/Ge for Germanium-on-Insulator (GeOI)
Si/Si3N4
Glass (borofloat, non-alkali): Si/Glas, Glass/Glass
Compound semiconductors: GaAs, GaP, InP
Polymers: PMMA, Cyclo Olefin Polymers

"Best Known Method" recipes available for users for the above and for other materials (full list available on request)

EVG®301

Features

  • High-efficiency cleaning using 1 MHz megasonic nozzles or area transducers (option)

  • Brush scrubbing for single-side cleaning (option)

  • Diluted chemicals for wafer cleaning

  • Prevents cross-contamination from back to front side

  • Fully software controlled cleaning process

  • Options

    • Pre-bonding station with IR-inspection

    • Tooling for non-SEMI standard substrates

echnical Data

Wafer diameter (substrate size)200, 100 - 300 mmCleaning systemOpen chamber, spinner and cleaning armChamber: made of PP or PFA (option)Cleaning media: DI-water (standard), other cleaning media (option)Spinner chuck: vacuum chuck (standard) and edge handling chuck (option) made of metal ion free and clean materialsRotation: up to 3000 rpm (in 5 sec)Megasonic nozzleFrequency: 1 MHz (3 MHz option)Output power: 30 - 60 WDI-water flow rate: up to 1.5 liter/minEffective cleaning area: Ø 4.0 mmMaterial: PTFEMegasonic area transducerFrequency: 1 MHz (3 MHz option)Output power: max. 2.5 W/cm² active areas (max. output 200 W)DI-water flow rate: up to 1.5 liter/minEffective cleaning area: triangle shape that guarantees radio uniformity on whole wafers per each rotationMaterial: SS and sapphireBrushMaterial: PVAProgrammable parameters: brush and wafer speed (rpm)Adjustable parameters (brush compression, media dispense)
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