应用领域：电子/电器/半导体，电子/电器/半导体
检测样品：PDP等离子体显示屏
检测项目：厚度，光学常数
方案摘要
For multilayer structures it is always helpful and often necessary to know the properties of each film. Using the Jobin Yvon UVISEL NIR it is a straightforward procedure to investigate the thickness and optical properties of the complete PDP structure.
