应用领域:其他,其他
检测样品:光伏器件
检测项目:厚度,光学常数
Spectroscopic ellipsometry is an ideal technique to characterize film thicknesses and optical constants for photovoltaic applications. Spectroscopic ellipsometers are also sensitive to the presence of rough overlayer and graded optical constants.
The technique provides the advantage to be fast, simple to operate and non-destructive for the characterization of the samples.