应用领域:纳米材料
检测样品:GaN纳米线
检测项目:拉曼成像
In summary, we have performed a complete Raman polarized study of a single GaN nanowire using a confocal microscope together with a high resolution stage. The high spatial resolution of our Raman confocal instrument together with a piezoelectric stage demonstrates unambiguously the possibility to image the optical properties of nanoobjects with a resolution better than 200 nm keeping the full advantages of the polarization control under a confocal microscope.