The fast mapping capability of the XGT-5000, with simultaneous XRF and transmission detection, allows gemstones to be analysed for composition, structure and quality. 

Lead glass fillers used to repair low grade rubies can quickly be identified by their distinctive elemental signatures, and allow high and low quality stones to be easily distinguished using micro-XRF. 

Moving beyond the more standard analysis, the XGT has also been used for high resolution imaging of crystalline phases in a ruby, by monitoring the intensity of specific diffraction bands within the EDXRF spectrum.