The fast non-destructive elemental mapping capability of the XGT-5000 is ideally suited to probing intricate features within electronic components. With the narrow, high intensity beam delivered by the unique HORIBA x-ray guide tube (diameters down to 10 µm) even the smallest detail can be observed.

Additional quantitative information on elemental composition is proving vital for manufacturers across the world to ensure their products comply with the forthcoming RoHS and ELV directives, which restrict the use of specific harmful elements such as Lead and Cadmium.