The XGT-5000 offers a fast, non-destructive technique for elemental mapping and transmitted x-ray analysis, and as such is a particularly useful tool for internal analysis of electronic components.

The ground breaking mono-capillary X-ray Guide Tube technology (HORIBA patent) provides high intensity beams with optimised collimation and diameters down to 10 µm, allowing even the smallest electronic features to be analysed.