EXPLORER 多功能X射线...
参数指标我要纠错

X Ray GeneratorMaximum Output Power3 kW (option: 4 kW)
Output Stability< 0.01 % (for 10% power supply fluctuation)
Max Output Voltage60 kV
Max Output Current60 mA (option: 80 mA)
Voltage Step Width0.1 kV
Current Step Width0.1 mA
Ripple0.03% rms < 1kHz, 0.75% rms > 1kHz
Preheat and RampAutomatic preheat and ramp control circuit
Input Voltage220 Vac +/-10%, 50 or 60 Hz, single phase
SizeWidth 48.3 cm, height 13.3 cm, depth 56 cm
X-Ray TubeTypeGlass (option: Ceramic), Cu Anode, Fine Focus (options: any kind of X-Ray tube)
Focus0.4 x 8 mm FF (other options available)
Max Output3.0 kW
GoniometerConfigurationsHorizontal and vertical Theta/2Theta and Theta/Theta geometry
Measuring circle diameters400 - 500 - 600 mm or any intermediate settings
Scanning Angular Range- 110° < 2 Theta < + 168° (according to accessories)
Smallest selectable stepsize0.0001°
Angular reproducibility+/- 0.0001°
Modes of operationContinuous scan, step scan, theta or 2 theta scan, fast scan, theta axis oscillation
Divergence slits4°; 2°; 1°; 1/2°; 1/4°
Anti-Divergence slits4°; 2°; 1°; 1/2°; 1/4°
Receiver slits0.3; 0.2; 0.1 mm
Soller slits
DetectorTypeScintillation counter Nal (options: YAP(Ce); multistrip)
Countrate2 x 10(6) cps
HV/PHAHigh voltage supply 600 - 2000 V, gain, low, central and high level control
CaseDimensionsWidth 1400 mm, heigh 1800 mm, depth 850 mm
Leakage X-rays< 1 mSv/Year (full safety shielding according to the international guidelines)
Processing UnitComputer TypePersonal Computer, the latest version
Items controlledX-ray generator, goniometer, sample holder, detector, counting chain
Basic Data ProcessingQualitative and quantitative phase analysis. Rietveld analysis, crystalline structural analysis, crystallite size and lattice strain, crystallinity calculation, strain, reflectometry.


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