IMAGING MODES | TEM, SEM, STEM, ED |
Basic TEM | |
Resolving power | 2.0 nm |
Total Magnification | 2,200-230,000x |
TEM BOOST | |
Resolving power | 1.2 nm |
Total Magnification | 1,400-700,000 |
ED (Electron Diffraction) | |
Minimum Probe Size | 100 nm |
Camera Length (binning 1x1) | 2,100 Pixels |
Camera Constant (binning 1x1) | 36.3 nm pixels |
STEM | |
Resolving Power | 2.0 nm |
Max. Magnification | 250,000x |
Max. Field of view | 25 x 25 um |
SEM (BSE detector) | |
Resolving Power | 4.0 nm |
Max. Magnification | 100,000x |
Max. Field of view | 200x200um |