Ultimate spatial resolution for SEM-EDS
Sub 10nm element characterisation in the FEG-SEM
Surface science sensitivity
Characterise surfaces in the SEM
Materials discrimination at the lowest kV
Down to 1kV materials characterisation
Fastest and most accurate nano-characterisation
Fast collection, real-time data processing from a bulk sample
Extreme light element sensitivity
New levels of detectability for elements such as lithium, nitrogen and oxygen
驱动系统的终极空间分辨率
FEG-SEM 中的亚10nm 元素特征
表面科学灵敏度
在扫描电镜中描述曲面
zei低千伏时的材料歧视
可达1kV 材料的特性
zei快、zei精确的纳米特性
从批量采样中快速收集实时数据处理
极高的光元件灵敏度
锂、氮和氧等元素的可探测性达到新水平