The C-Swift detector sets a new standard when speed is key:

• Guaranteed indexing speeds of 1000 pps using only 12 nA beam current

• 156 x 128 pixel pattern resolution at maximum speed – 4 times more pixels than a fast CCD detector at comparable speeds

• Full resolution (622 x 512) patterns – ideal for detailed phase and deformation analyses

• Low distortion optics, ensuring an angular precision better than 0.05°.

• High sensitivity with an optimised phosphor screen, ensuring high quality patterns at low doses and low beam energies – resulting in maximum spatial resolution

• Seamless EDS integration even at the highest speeds

• Bellows SEM interface, maintaining the microscope’s vacuum integrity

• Unique proximity sensor – detects potential collisions before they happen and automatically moves the detector to a safe position

• Simple and intuitive detector settings, ensuring optimum results every time

• Five integrated forescatter detectors, providing full colour complementary channelling contrast and atomic number contrast images.