【技术特点】-- Fischione 双束精修系统 1080

Optimal TEM specimen preparation done First Time Right

• Achieve ultimate specimen quality – free from amorphous and implanted layers

• Complements FIB technology

• Milling without introduction of artifacts

• Advanced detector technology for imaging and precise endpoint detection

• In situ imaging with ions and electrons

• Microscope connectivity for risk-free specimen handling

• Adds capability and capacity

• Fast, reliable and easy to use

【技术特点对用户带来的好处】-- Fischione 双束精修系统 1080

【典型应用举例】-- Fischione 双束精修系统 1080