光电流成像系统参数指标

参数指标

我要纠错

性能优势：

激光扫描：

- 优越的分辨率 & 重复性

resolution < 0.02 um & repeatability < 0.1 μm.

- 大面积拉曼成像范围

scan area exceeding 200 x 200 μm using a 40X, NA=0.75 objective

- 接近衍射极限的光斑，覆盖扫描区域

独有的透射式体相位全息光栅技术

- 同类产品中最高的衍射效率，高光透过率

- 偏振相关性小

平均模式

- 高速平均模式

4秒内能获得200 x 200 μm区域的某一拉曼光谱

- 最小化CCD 读出噪声影响，

CCD在激光扫描同时获取拉曼光谱，能很大程度减少传统2D拉曼mapping方法中无法避免的读出噪声的影响

- 快速定量分析

能有效的快速分析载玻片中薄膜样品或纳米微粒

模块化设计（可选项）

- 光纤耦合激光器端口

- 针对多种波长的嵌入式滤波器

- 起偏器

- 窄贷拉曼滤波器选项（低至10 cm-1)

- NIR近红外选项 (700 ~ 1000 nm)

主要技术参数

激光器	532nm，up to 100mW DPSS laser
(Otherlaser sources such as 660nm，785nm are available )
显微镜	Large-size mechanical stage with right-hand control
Reflected LED illuminator for bright field
Quintuple Revolving Nosepiece
USB2.0 Full HD camera
标准物镜	x40 NA=0.75 ““
>60% transmission from 360 to 1000 nm
光谱仪(XPE200)	Input f/5
Focal length 200 mm
1800 lpmm VPHG grating (for 532nm excitation)
Micrometer for center wavelength adjustment
FWHM resolution ~ 0.12 nm
Dispersion ~0.038 nm/pixel (16um/pixel)
探测器	Most Andor and PI cameras can be used

可选配置

单模保偏光纤FC/PC接口

Achromatic collimator for 450~680 nm

No moving parts

光偏振控制

>> Excitation polarization control

0~180°continuous rotation of excitation laser polarization

Operating wavelength : 532+/-20nm

Utilize a zero order half wave plate>>Collection polarizer

Operating wavelength: 420~700 nm-

Extinction ratio > 200:1

Transmission > 83%

窄贷滤波器 (OD7)

>>Bandpass filter

Bandwidth (FWHM) < 0.3 nm

Diffraction efficiency > 90%

>>Notch filte

Blocking > 99.9999% (OD3 + OD3)

Transmission > 50%

Bandwidth (FWHM) < 0.5 nm

激光器

Optimized for raster scan

Wavelength range: 450 ~ 700 nm

FOV: 200 X 200 um using a 40X objective

Single Protected silver mirror (450~1000 nm) for XY scan

>> Laser scan controller

USB 1.1-Labview example provided

激光功率控制

Variable ND filter (OD 0.04~4)

Laser power monitor photodiode output (BNC connector)

主要应用：

生物

- Cell research / Disease detection / Stents and implants

- Cosmetics and in vivo skin analysis

法医检测

-The non-destructive and in-situ identification of controlled drugs and narcotics.

制药学, 化妆品和食品学

-Characterization and Mapping of active pharmaceutical ingredients and excipients

半导体，太阳能电池和OLED

-Strain measurements of a Si cap layer deposited on a SiGe substrate determination of Ge content - Defects identification during the manufacturing process

- Defects identification during the manufacturing process

固体状态材料

- Analysis of Solid State Chemical Reactions and Composite

- Raman Maps Identify and Located Phases.

我要提交参数指标