技术参数：

FAQ:

• What is the recombination lifetime?

• How does the solar cell efficiency depend on the lifetime?

• What determines the lifetime in silicon?

• How is lifetime measured by the Sinton Instruments tools?

• How is the data analyzed?

• Can you measure surface recombination velocity?

• Does the system measure emitter saturation current density?

• Can wafers be measured with no surface passivation (“out of the box”)?

• Can any of these instruments do lifetime maps?

• How do these measurements compare to microwave PCD?

• What lifetimes can be measured?

• What is the smallest sample size?

• How do you measure bulk lifetime on blocks or ingots?

• At what carrier density should I report the result?

• Can the lifetime tester be used to detect Fe contamination?

• How is the instrument calibrated?

• When should wafers be tested inline?

• Does the lifetime tester measure the trapping?
　

Module and Cell Flash Testers frequently asked questions