相位延迟量范围:

0.005 to 120+   nm

0.005 to 300+   nm

相位延迟量测量分辨率/
  重复精度^{1, 2, 3}:

0.001 nm / ±   0.008 nm

0.0

1 nm / ± 0.015   nm

角度测量分辨率 /
  重复精度¹:

0.01o / ±   0.05°

0.01o / ±   0.07°

测量速率 / 时间⁴:

up to 100 pps   /
  sample size dependent

尺寸:

910 mm (H) x   415 mm (W) x 700 mm (D)

光源波长⁵:

Various (632.8   nm standard)

测量光斑⁶:

Between 1 mm   and 3 mm native
  (can be as low as 50 μm)

内置测量调制频率:

PEMLabs^TM Photoelastic   Modulator
  50 kHz or 50/60 kHz

解调分析技术:

Hinds   Instruments Signaloc^TM
  Lock-in Amplifier or Wave Form
  Capture Card

测量单位:

nm   (retardation), ° (angle)