Multilayers XS-55, XS-N, XS-C, XS-B

Multilayers are not natural crystals but artificially produced “layer analyzers.” The lattice plane distances d

are produced by applying thin layers of two materials in alternation onto a substrate (Fig. 18). Multilayers

are characterized by high reflectivity and a somewhat reduced resolution. For the analysis of light

elements the multilayer technique presents an almost revolutionary improvement for numerous

applications in comparison to natural crystals with large lattice plane distances.

Fig.>