| Multipoint scan or single-point thickness measurement |
| 10 microns to full thickness (1 mm) range of measurement (15 nm to 1 mm thick when configured with #15-51000 Spectrometer) |
| Motorized, automatic X/Y/Z (auto-focus) with <1s acquisition time |
| Automatic edge and corner detection aligns measurement grid with X-Prep® - including theta correction |
| Edge exclusion with X/Y input |
| Stage fitted with X-Prep® fixture adapter |
| “Drive to Coordinate“ software navigation |
| Viewing of either 2D plot/map or 3D graph |
| Supplied with Allied proprietary X-Correct™ software |
| CCD camera (#15-50020) must be purchased separately if not purchasing Visible Light Spectrometer (#15-51000) |
| Roughness - 15 micron finish |
| 100 mm x 100 mm stage travel |
| Software automation extendable through .NET |
| Data export using standard Windows methods |
| One (1) year warranty |
| Dimensions: 14“ W x 17“ D x 19“ H (355 x 431 x 483 mm) |
返回 Allied基材厚度测量仪... 
我要纠错
参考成交价格：