60512-20-3-2010
Connectors for electronic equipment – Tests and measurements – Part 20-3: Fire hazard tests – Test 20c: Flammability@ glow-wire (Edition 1.0)

Connecteurs pour équipements électroniques – Essais et mesures – Partie 20-3: Essais relatifs aux risques du feu – Essai 20c: Inflammabilité@ fil incandescent (Edition 1.0)


60512-20-3-2010 发布历史

Scope and object This part of IEC 60512@ when required by the detail specification@ is used for testing connectors within the scope of technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this standard is to detail a standard test method to determine the flammability of a connector when exposed to a glow-wire test under specified conditions. The glow-wire test simulates thermal stresses which may be produced by such sources of heat or ignition as@ for example@ glowing elements or overloaded components@ for short periods@ in order to assess by a simulation technique the fire hazard or burning of a single electronic component.

60512-20-3-2010由IEC - International Electrotechnical Commission 发布于 2010-06-01,并于 2013-06-28 实施。

60512-20-3-2010的历代版本如下:

  • 2010年06月01日 60512-20-3-2010 Connectors for electronic equipment – Tests and measurements – Part 20-3: Fire hazard tests – Test 20c: Flammability@ glow-wire (Edition 1.0)

 

 

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标准号
60512-20-3-2010
发布日期
2010年06月01日
实施日期
2013年06月28日
废止日期
中国标准分类号
/
国际标准分类号
/
发布单位
IEC - International Electrotechnical Commission
引用标准
16
适用范围
Scope and object This part of IEC 60512@ when required by the detail specification@ is used for testing connectors within the scope of technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this standard is to detail a standard test method to determine the flammability of a connector when exposed to a glow-wire test under specified conditions. The glow-wire test simulates thermal stresses which may be produced by such sources of heat or ignition as@ for example@ glowing elements or overloaded components@ for short periods@ in order to assess by a simulation technique the fire hazard or burning of a single electronic component.




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